Used HITACHI M 8170 XT #9137307 for sale

HITACHI M8170 XT scanning electron microscope (SEM) is a high-performance electron microscope for advanced research and imaging. It utilizes a dual-beam technology to enable the manipulation of three dimensional structures at nanometric resolutions. This state-of-the-art electron microscope has a high-performance column that is combined with a wide variety of high-end detectors. M8170 XT has a built-in high-resolution field emission electron gun (EGE) that can be operated up to 5kV so that it can be used for versatile applications. The microscope also has a 10kV electron gun for precise sample imaging and a zero-tilt microscope stage for higher resolution imaging. The chromium-coated EGE can be used for microstructure observation and species analysis of light elements like carbon and oxygen. By using the high-performance lens system and the EGE, HITACHI M8170 XT can achieve an astonishingly high spatial resolution of <1 nm. The high-definition imaging of the objective lens system offers a resolution of 0.7 nm in backscatter and 0.25 nm in secondary electrons. This ensures that you can capture detailed information about samples without compromising the resolution in imaging. Additionally, M8170 XT supports the use of photothermal excitation, in which an ultrafast laser pulse pulse is used in order to obtain nanoscale mapping capabilities. It can also be used to image the distribution of elemental elements in the sample with high precision. HITACHI M8170 XT is also highly adaptable for complex sample characterization. Its scanning platform offers multimodal scanning with Electron Beam Induced Deposition (EBID), Energy Dispersive X-ray Analysis (EDXA), and Energy Filtering Transmission Electron Microscopy (EFTEM). This allows the user to opt for the best approach for their samples. The advanced control of M8170 XT has multiple functions like automatic focus, automated SEM image acquisition, and auto scan size option. This provides a high quality imaging every time you want to view nanostructures in great detail. HITACHI M8170 XT scanning electron microscope is a versatile tool for advanced research and imaging. It features a high-performance lens system, high-resolution field emission electron gun, and a range of high-end detectors. This electron microscope offers amazing spatial resolution of <1 nm and allows for the multimodal scanning of sample surfaces with EBID, EDXA, and EFTEM. Furthermore, it can also be used for photothermal excitation to provide nanoscale mapping capabilities. Finally, it is also very user-friendly with automatic focus, automated SEM image acquisition, and auto scan size option making it an outstanding tool for advanced imaging.