Used LAM RESEARCH / ONTRAK 2300 Kiyo45 #9255639 for sale

LAM RESEARCH / ONTRAK 2300 Kiyo45
ID: 9255639
Wafer Size: 12"
Vintage: 2013
Etcher, 12" 2013 vintage.
LAM RESEARCH / ONTRAK 2300 Kiyo45 is an etcher/asher used in the fabrication of integrated circuits and other microelectronic devices. This advanced etcher/asher is designed to provide high-quality outcomes with maximum repeatability and minimum downtime. The system is specifically engineered for high etch/ash rates, with advanced features for high particle selectivity and wafer flatness. ONTRAK 2300 Kiyo45 has an efficient process chamber design, which helps to ensure maximum throughput. The chamber contains specialized targets for various etching and ashing processes, along with multiple components, which provide different optimized results. This etcher/asher is also equipped with optical sensors and vision alignment systems to ensure that the substrate is placed in the precise location. This etcher/asher's advanced particle selectivity has enabled it to achieve superior removal rates. The integrated sensor technology provides a far more accurate prediction of etch/ash rates than was previously achievable, while also enabling better control over the particle characteristics. This technology allows for the optimization of etch/ash processes and for the fast and accurate selection of the desired material. LAM RESEARCH 2300 Kiyo45 also has an integrated wafer flatness module, which provides stability during etch/ash processes and helps ensure that the entire wafer is covered evenly. This system is designed to ensure repeatable outcomes and uniform coverage of the entire surface, even on the most challenging wafers. Overall, 2300 Kiyo45 provides superior performance with its advanced etch and ashing capabilities. Its efficient process chamber design, along with its optical sensors, enables higher throughput, and its integrated targeting systems ensure maximum reliability. Furthermore, its advanced particle selectivity and wafer flatness modules provide superior results, which help to ensure that the desired outcomes are achieved with minimal downtime.
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