Used AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 4082F #9411925 for sale

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ID: 9411925
Wafer Size: 6"
Parametric tester, 6" Non-SMIF Type 24- Pin boards N9158-60001 HV-SPGU Pulse generator N9180-N61010 THPS (2) SMU Medium powers: Current measurement resolution: 10 fA Voltage measurement resolution: 2 µV Maximum voltage: 100 V Maximum current: 100 mA SMU High power: Current measurement resolution: 10 fA Voltage measurement resolution: 2 µV Maximum voltage: 200 V Maximum current: 1000 mA 3458A Digital voltage meter: Voltage measurement resolution: 1 µV Level resistant measurement: 1 Ω PC: XW8400 Workstation E3632A Power supply.
AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 4082F Final Test Equipment is a multi-bay, high performance test system designed to offer flexible capability and value-added features. This test unit is used to provide a comprehensive test capability; with enhanced fault isolation, reliable and accurate test coverage, and overall cost savings. HP 4082F is a multi-bay machine that is easily configured to the customer's needs, offering a range of modules to meet the most demanding test requirements. The main module consists of six separate testing areas, including an Oscilloscope, DMM, DCS+, current probes and logic probes. Each test point can be individually configured for the specific application. The Oscilloscope module has a maximum sampling rate of 20V/s and is capable of storing up to 128 cycles from each measurement. The Dual-Mode DMM measures voltage, current and resistance and features a graphical backplane to provide real-time input and output values for each channel. The DCS+ module adds additional digital capture and logic analysis capabilities. AGILENT 4082F also offers enhanced test flexibility with the option of additional current probes and logic probes. Current probes are capable of capturing dynamic parameters with up to 60V of peak voltage, while the logic probes feature a built-in non-volatile memory which can store up to 4096 events at 1MHz. The overall architecture of KEYSIGHT 4082F provides both efficient testing and reliable, accurate results. By providing multi-bay capabilities, the tool can be configured to provide comprehensive test coverage, while offering enhanced fault isolation. This asset combines comprehensive test coverage and enhanced fault isolation, allowing for efficient and reliable testing that delivers accurate results and cost savings, making it an ideal solution for final test applications.
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