Used AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT E6640A #9262482 for sale

AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT E6640A is a high-performance, economical, and easy-to-use final test equipment designed to reduce time to market and reduce operational costs. It provides advanced test automation capabilities for test engineers and manufacturing engineers in various industries. HP E6640A Test System combines superior performance and unparalleled flexibility that growing businesses need to boost production. AGILENT E6640A hosts up to four AXIe or LXI slots, allowing it to integrate into virtually any existing or newly established test systems. Each AXIe slot can accommodate up to two AXIe chassis to provide up to eight card slots for a single-box solution. Additionally, the unit's 16 external PXIe and LXI slots provide additional test resources for the most complex applications. This allows the machine to be easily adapted to various test requirements, providing optimal performance with minimal effort. E6640A supports various HP test solutions such as battery and power IC testing, DC source and memory, and high frequency device measurement, making it a great choice for different companies. The tool also offers powerful tools to help test engineers create and work with their automated test systems. It has the capability to store and process large amounts of data, making it ideal to use for advanced test platforms. Equipped with a 12-core processor, 4GB RAM, and AMD Radeon Pro W2100 graphics card for high-level visualization, KEYSIGHT E6640A delivers a smooth user experience. It offers a software-interface tool to integrate user-specific hardware and software into the asset. This enables test engineers to perform powerful analysis on collected data and measure test results accurately. HEWLETT-PACKARD E6640A is an ideal solution for customers who need a highly configurable and reliable model for their final test needs. Its power, flexibility, and robust performance make it an optimal choice for both development and production test processes.