Used AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT V4400 #9003447 for sale

AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT V4400
ID: 9003447
Chiller.
AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT V4400 is a fully automated Final Test equipment for RF/Microwave products. The system provides superior performance for the measurement, analysis, testing, and troubleshooting of RF components from DC to 44GHz. The unit consists of an RF Receiver, a Network Analyzer, two switch matrices, a programmable attenuator, and two standard power sensors, all integrated into a single chassis housed in a 19" rack. The Receiver portion of the machine has a frequency range of DC to 44GHz and a built-in sensitivity of up to -127 dBm. It includes a broad range of signal analysis and monitoring tools including an automatic frequency waypoint locator, integrated data logging, a trace shaping feature, and a bandpass windowing mode. It also includes capability to measure two-tone intermodulation distortion, amplitude precision sweeps, and single tone testing. The Network Analyzer included features a frequency range of 75MHz to 40GHz with a stability that allows measurement on frequency-offset and odd-harmonic sources. It includes a multitude of powerful analysis tools and software that enable time-domain measurements including harmonic distortion, jitter, phase noise, group delay, single-tone IMD, and a wide range of vector network analysis. The two Switch Matrices included in the tool providing a matrix of 32 ports and 8 channels per port. These matrices are used to perform automated testing of multiple devices simultaneously, including differential measurement, temperature control, and capacitive loading. The Programmable Attenuator is a high-performance attenuator with a range of 0 to 139dBm in 0.5 dB steps. It is used to precisely set the input power level of components being tested. Finally, the two Standard Power Sensors enable input power measurements of up to +30dBm at frequencies up to 40GHz. As a fully integrated asset, HP V4400 offers superior performance and functionality for numerous RF and microwave device test, analysis, and troubleshooting applications.
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