Used AGILENT / HP / HEWLETT-PACKARD / VERIGY / ADVANTEST 93000 C200e #156481 for sale

ID: 156481
Vintage: 2003
Tester ACCRETECH / TSK UF 190A prober Standard TSK Hot chuck, 35-150 degrees Automatic probe-pad alignment Probe mark inspection Multi-site 3-64 channels probing GP-IB interface Fail-mark inspection Off-site marking Automatic probe height setup Sample sort capability Soak time Multi-pass probing Dual alignment model by prober kind Binary Data Transmit Bump height Rectangular probe card holder Includes: Clock board AC/DC board (2) DC/DC board Control board PoGo segment 512 pin soc Linux workstation Switch Box 93000 Controller System type: SOC Test head: small DUT I/F: SOC P600 16 Pin C200E 368 Pin Vector memory: ch10101-10116 112M P600 ch10201-12416 28M C200E TIA E9690 WDA E9684 WDB E9686 WGC E9689 WGB E9688 MCA E9714 (AV8 board) WGA E9685 DPS GPDPS 16 ch 2003 vintage.
AGILENT / HP / HEWLETT-PACKARD / VERIGY / ADVANTEST 93000 C200e Final Test Equipment is an automated high-speed test system designed for the testing of integrated circuits (ICs) and mixed-signal components. It is equipped with advanced C200e digital protocol, an automated module and instrument control, in-circuit scan chain debugging and programming capabilities, and multiple operator interface options for increased productivity during IC development, production, and validation stages. HP 93000 C200e Final Test Unit works with a wide range of components, ranging from low-cost logic chips and complex industrial controls, to MEMs and processors. Through its automated machine and instrument control, VERIGY 93000 C200e Final Test Tool is able to access each chip's registers and inputs, and write test commands to each chip. It is also able to support multiple platform architectures, such as x86, ARM, MIPS, PowerPC, DSP and FPGA, by using a single test program. AGILENT 93000 C200e Final Test Asset is also able to quickly examine each chip's digital and analog behaviors and parameters, providing a complete picture of the chip's functionality. Furthermore, HEWLETT-PACKARD 93000 C200e Final Test Model offers a wide variety of test techniques, such as low power testing, multi-level testing, SCAN devices, and emulation. The equipment also uses digital Imaging Correlation (DIC) software to analyze and characterize ICs, while its high-speed program generator can build test programs from different performance-related levels. Moreover, user-driven test-sequencing options allow users to optimize tests based on their specific requirements. In addition to testing ICs, ADVANTEST 93000 C200e Final Test System is also able to generate detailed test histories, reports and failure data, allowing engineers to precisely identify problematic ICs and other defects. This data can also be used to quickly modify and improve the test procedure for increased reliability. All in all, 93000 C200e Final Test Unit is an advanced and comprehensive test solution for integrated circuits and other components. Its automated machine and instrument control, advanced test techniques, and comprehensive analysis capabilities will help engineers quickly identify and optimize design flaws and errors, while providing reliable and comprehensive test results.
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