Used AGILENT / HP / HEWLETT-PACKARD / VERIGY / ADVANTEST 93000 C200e #156481 for sale
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ID: 156481
Vintage: 2003
Tester
ACCRETECH / TSK UF 190A prober
Standard TSK Hot chuck, 35-150 degrees
Automatic probe-pad alignment
Probe mark inspection
Multi-site 3-64 channels probing
GP-IB interface
Fail-mark inspection
Off-site marking
Automatic probe height setup
Sample sort capability
Soak time
Multi-pass probing
Dual alignment model by prober kind
Binary Data Transmit
Bump height
Rectangular probe card holder
Includes:
Clock board
AC/DC board
(2) DC/DC board
Control board
PoGo segment 512 pin soc
Linux workstation
Switch Box 93000 Controller
System type: SOC
Test head: small
DUT I/F:
SOC P600 16 Pin
C200E 368 Pin
Vector memory:
ch10101-10116 112M P600
ch10201-12416 28M C200E
TIA E9690
WDA E9684
WDB E9686
WGC E9689
WGB E9688
MCA E9714 (AV8 board)
WGA E9685
DPS GPDPS 16 ch
2003 vintage.
AGILENT / HP / HEWLETT-PACKARD / VERIGY / ADVANTEST 93000 C200e Final Test Equipment is an automated high-speed test system designed for the testing of integrated circuits (ICs) and mixed-signal components. It is equipped with advanced C200e digital protocol, an automated module and instrument control, in-circuit scan chain debugging and programming capabilities, and multiple operator interface options for increased productivity during IC development, production, and validation stages. HP 93000 C200e Final Test Unit works with a wide range of components, ranging from low-cost logic chips and complex industrial controls, to MEMs and processors. Through its automated machine and instrument control, VERIGY 93000 C200e Final Test Tool is able to access each chip's registers and inputs, and write test commands to each chip. It is also able to support multiple platform architectures, such as x86, ARM, MIPS, PowerPC, DSP and FPGA, by using a single test program. AGILENT 93000 C200e Final Test Asset is also able to quickly examine each chip's digital and analog behaviors and parameters, providing a complete picture of the chip's functionality. Furthermore, HEWLETT-PACKARD 93000 C200e Final Test Model offers a wide variety of test techniques, such as low power testing, multi-level testing, SCAN devices, and emulation. The equipment also uses digital Imaging Correlation (DIC) software to analyze and characterize ICs, while its high-speed program generator can build test programs from different performance-related levels. Moreover, user-driven test-sequencing options allow users to optimize tests based on their specific requirements. In addition to testing ICs, ADVANTEST 93000 C200e Final Test System is also able to generate detailed test histories, reports and failure data, allowing engineers to precisely identify problematic ICs and other defects. This data can also be used to quickly modify and improve the test procedure for increased reliability. All in all, 93000 C200e Final Test Unit is an advanced and comprehensive test solution for integrated circuits and other components. Its automated machine and instrument control, advanced test techniques, and comprehensive analysis capabilities will help engineers quickly identify and optimize design flaws and errors, while providing reliable and comprehensive test results.
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