Used AGILENT / HP / HEWLETT-PACKARD / VERIGY / ADVANTEST 93000 PS400 #9175350 for sale

AGILENT / HP / HEWLETT-PACKARD / VERIGY / ADVANTEST 93000 PS400 is a high performance, cost effective, and comprehensive final test equipment specifically designed for semiconductor test and design. This system is based on a three-layer platform consisting of HP Test Executive (VTE) software, test unit hardware, and device-level programming algorithms. The VTE software provides a comprehensive automated test development environment and test program generators that allow users to quickly develop a test program for a particular device. The test machine hardware provides an automated test and measurement interface to the device under test. It includes a high-speed programmable DUT console and a series of modules that can be added as needed to optimize measurement resolution. The device-level programming algorithms provide efficient device-specific commands for programming and controlling the DUT. HP 93000 PS400 test tool offers an ideal solution for high speed, high throughput semiconductor testing. The integrated asset allows users to quickly develop sophisticated test programs and to execute them efficiently. This model offers superior test performance, low cost, and maximum test coverage. The VTE software reduces time-to-market for new products by providing an automated test development environment. The test equipment hardware is designed to enable high-speed test and high throughput test execution. The device-level programming algorithms ensure optimal device performance and provide reliable data. VERIGY 93000 PS 400 system provides a comprehensive and efficient final test solution for modern semiconductor devices. The innovative three-layer platform enables users to quickly develop automated test programs and execute them efficiently. The automated test development environment provides users with the tools for developing sophisticated test programs. The high-speed programmable DUT console and a variety of modules ensure maximum performance and test coverage. The device-level programming algorithms ensure optimal device performance and reliable data. This unit is efficient, cost effective, and provides a comprehensive solution for final test of semiconductor devices.