Used AGILENT / HP / HEWLETT-PACKARD / VERIGY / ADVANTEST 93000 #9177740 for sale

AGILENT / HP / HEWLETT-PACKARD / VERIGY / ADVANTEST 93000 is a final test equipment designed for high-volume productions. It is the latest in HP 93000 series and is capable of testing an impressive number of devices in parallel, meaning that it can be used to meet high throughput demands in production. It is designed for paralleling, with a modular architecture that can be easily expanded from a base configuration of 8 to 256 test sites. There are also a number of different slot configurations that can be utilized, which allows for further flexibility. The system is extremely versatile and can be used for both basic and complex test applications. It is also well-suited for testing digital, analog, and mixed signal semiconductor devices. Verification is also possible, with the unit supporting automatic device characterization. The machine is used with a suite of software in order to perform the necessary tests. This software includes support for programming devices, playing out characterization files, verifying devices, running datasets, collecting results, and analyzing data. The tool utilizes a combination of optical and contact measurements in order to provide greater precision. This asset is designed to minimize setup time, optimize test time, and provide reliable test results. It also supports a number of different types of test platforms, from low-cost probes to high-temperature sockets. The model has a number of versatile features, such as its ability to support a wide range of probing cards, device types, and test patterns, that make it suited for a variety of applications. It is well-suited for both high-volume screening and debug test applications. In addition, the equipment offers an impressive range of diagnostic capabilities, such as its datalogging and oscilloscope-like waveform playback. This helps to reduce test time and quickly identify any potential problems. VERIGY 93000 is an ideal tool for production testing and characterization of semiconductor devices. With its advanced features, high-performance, and versatility, it is capable of providing reliable, accurate, and high-quality test results.