Used AGILENT / HP / TSK 9492B / UF 200 #9220210 for sale

AGILENT / HP / TSK 9492B / UF 200 is an advanced test equipment designed to evaluate the performance of complex electronic devices on a final test basis. Its modular design makes it suitable for any type of test application, from simple low-level measurements to high-end multi-system integration tests. The unit consists of an HP 85020A Signal Generator, an TSK 8753C Network Analyzer, and AGILENT UF-200 Universal Interface. AGILENT / HP / TSK 85020A Signal Generator module produces modulated electrical signals with low signal levels, ideal for measuring small signals buried in spurious noise. HP 8753C Network Analyzer performs tests on a device under test (DUT) for testing its linearity and frequency response characteristics. It also has a harmonic distortion measurement feature for more rigorous analysis. TSK UF-200 Universal Interface is designed for high-precision and fast control over test components, providing comprehensive and repeatable test results. It can be interfaced to any external machine for DUT control and can configure multiple tests on the tool simultaneously. In addition to providing the performance benefits of the individual components, HP 9492B / UF 200 asset also offers the enhanced benefits of test automation. Automation makes sophisticated feature testing easier by taking care of the tedious aspects such as setting up parameters, calibrating test instruments, and collecting data. The automated model also improves the accuracy and repeatability of the test results by providing a consistent level of performance in each test cycle. Furthermore, TSK 9492B / UF 200 test equipment provides an efficient platform for integrating other test systems, such as AGILENT 8753A Scattering Parameter Network Analyzer, and can even be connected to a range of third-party test solutions. This allows users to set up customized configurations to suit their specific testing needs. Overall, AGILENT 9492B / UF 200 test system is a robust and reliable platform capable of providing high-quality and accurate measurements in a wide range of test scenarios. It is an ideal choice for those needing to evaluate the performance of today's complex electronic devices on a final test basis.