Used BXM 2010MEL #9225031 for sale
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ID: 9225031
EL Tester
Resolution: 16 M
Room temperature: 30°C
Exposure time: 1-60S Adjustable
EL Image display:
Zoom
sample code display
Image processing:
Gain
Gray scale
Shear
Rotate
Search: Bar code & date
Operating system: WINDOWS XP
Air supply requirements: 0.6~0.8 MPa
Maximum testing range: 2000x1000 mm
Testing cycle: 20s
Power up mode:
Before lamination: Module is charged connection by clip
After lamination: Module is charged connection by plug
Working environment:
Temperature range: +15°C~+40°C
Humidity range: 10%~75%
Power supply: DC100V / 10A
Power requirements: AC220V, 15A, 3kW.
BXM 2010MEL is an advanced final test equipment designed for the testing and analysis of modern, high-performance electronic components and assemblies. It is equipped with an industry-leading design architecture and advanced data processing and analysis capabilities which allows for rapid and accurate testing of products. This system is optimized for understanding the performance and functionality of various electronic devices, as well as the relationships between different components. 2010MEL features a comprehensive suite of testing software and hardware capabilities. The unit is comprised of a central controller, a housing for the test head which has environmental sensors that measure things like temperature and humidity, a temperature calibration unit, a test head with access ports for inserting the electronic components, a low-noise control stage with multiple channels, a programmable filter with low pass, high pass, band pass and notch filters, and a digital power supply. The machine is capable of conducting a variety of tests for various types of products including analog, digital, and mixed-signal components. It utilizes a wide range of techniques for testing medium- and large-scale integrated circuits and components such as switching, Boolean, time interval and static/dynamic measuring. The applied stimulation can be varied according to the characteristics of the product being tested. In addition, the test tool can provide extensive data processing capabilities such as time sequencing, spectral analysis, parametric data analysis and fast Fourier transforms. BXM 2010MEL is designed to be user-friendly and offers a comprehensive graphical user interface. The intuitive interface makes it easy for the user to create measurement setups, define tolerances and conditions, as well as set up stimulus and response for dynamic tests and analysis. The asset also allows for measurement replication, with test conditions, data analysis, results, and data logs that can be easily imported and exported. The configuration is stored in the administrative database, which allows for quickly replicating the previous tests. 2010MEL is a powerful, versatile, and cost-effective solution for final test and analysis of electronic components and assemblies. Its robust design, expansive capabilities, and intuitive user-interface make it an ideal model for mission-critical quality assurance and reliability testing in a wide array of applications.
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