Used IMS XTS-FT #9298871 for sale

IMS XTS-FT is a comprehensive test equipment for final testing of integrated circuits (ICs) during the IC manufacturing process. It is an automated IC and module test system that combines high-performance, high-resolution image capture along with IMS proprietary analysis and pinpointing algorithms to accurately diagnose an IC's performance quality. XTS-FT facilitates fast, reliable testing of ICs to improve test data accuracy, increase process yield and reduce device downtime. It has a built-in library of template sets for various IC types that can be easily customized and matched to a specific IC's design. This allows the test unit to optimize the device's performance parameters and reduce the amount of time to conduct testing. The machine offers a modular architecture with a variety of hardware and software components including an automated tool controller with one or more test module boards, an image acquisition subsystem and a set of STM techniques used to analyze and pinpoint IC defects. IMS XTS-FT can also be integrated with IMS advanced automatic defect identification asset to automate defect recognition. XTS-FT is a highly reliable model with a fail-safe design to ensure test results are accurate and reproducible. It also features built-in safeguards such as sensors and alarms to detect power fluctuations, environmental changes and other environmental risks that can affect testing accuracy. The equipment software components make use of patented algorithms to analyze data, pinpoint defects and calculate electrical parameters with greater accuracy and precision. IMS XTS-FT was designed for use in the manufacturing environment and is compliant with industrial safety regulations. It can be integrated with existing test systems and production lines with minimal setup and training time. XTS-FT also provides powerful functionality to support repeatable and traceable test results, to enable production monitoring, and to allow test results to be securely stored. Overall, IMS XTS-FT is a powerful and reliable test system for final testing of ICs during manufacture. It is capable of providing fast and reliable testing of ICs to ensure that ICs perform as expected and to optimize IC performance. By combining IMS advanced technologies, it allows for rapid and efficient identification of defect sources and provides highly accurate test results to reduce production downtime and maximize production yields.