Used KEITHLEY S600 #9256737 for sale

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Manufacturer
KEITHLEY
Model
S600
ID: 9256737
Parametric tester With prober cards KEITHLEY 776 Programmable counter / Timer TEKTRONIX VX1410 Intelliframe main frame Includes: 60100 VCM Board (PCI Mezzanine card) 60130 VHI Board (Test head / Power monitor) (6) 60110 SMU Boards 60110 CGK Board KEITHLEY 60180 Power supply assy KEITHLEY 60170 Power Distribution Unit (PDU) OMO 4036 Test head: REID ASHMAN HD144-25 KEITHLEY 1511 With preamp cards PAA Boards: 4, 5, 6, 11, 14 and 15.
KEITHLEY S600 Final Test Equipment is a high performance test and measurement solution designed for use in semiconductor wafer fabrication, burn-in, and incoming inspection applications. This system offers a comprehensive suite of test measurement capabilities combined with a wide array of peripheral options for customizing the configuration to specific requirements. KEITHLEY S 600 is equipped with a variety of advanced test and measurement instruments, including a many analog, digital, and sourcemeter channels, provide the capacity to perform a wide range of tests, such as load, pull-up, pull-down, stepper, and thermal tests. Additionally, a range of device parameter characterization features are also included. These include bound, source-pass, or separate switching for each channel, allowing for advanced measurements in single-sided or dual-sided mode. In addition to the state-of-the-art hardware, S-600 also incorporates the latest software, providing greater control over the test processes and the ability to quickly respond to changes in testing requirements. From pre-programmed test recipes to user-defined sequence files, the software allows for the flexibility to accurately control all of the unit's instrument channels and other peripherals. KEITHLEY S-600 is also equipped with a suite of monitoring and control features, providing full machine visibility and control, including real-time performance data, diagnostics, and other. This information is provided through an easy-to-use graphical user interface, which also allows for easy configuration of tool components. Additionally, S600 allows for simultaneous concurrent measurement, allowing multiple wafers for the same test to be performed at the same time. S 600 also offers a wide range of peripheral options allowing for greater customization to specific requirements. This includes an array of different optical input modules for measuring light intensity, intensity, and wavelength as well as a temperature chamber option for thermal cycling tests. With its reliable and configurable hardware and software, KEITHLEY S600 is the perfect solution for a variety of test and measurement needs in the semiconductor industry.
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