Used LORLIN Double Impact #184587 for sale
URL successfully copied!
Tap to zoom
ID: 184587
Discrete component test system
Specifications:
3-pin capability: emitter, base, and collector
Leakage tests
Voltage source - 1.000 V - 600.0 V
Current meas. - 100.0 pA - 200.0 mA
Voltage breakdown tests
Current source - 1.000 uA - 1.000 A
Voltage meas. - 100.0 mV - 600.0 V
ON tests
Base current - 10.00 uA - 20.00 A
Collector current - 10.00 uA - 20.00 A
Voltage meas. - 1.000 mV - 15.00 V
2000 V, 500 A
Includes (2) test stations for small signal and power semiconductors
(3) Test station capability standard, expandable to (5) stations with an optional SEU-220 expansion unit
Available options:
AC option
SCR option
VX option
HCM-201
HVS-201
SS-100
SS-150
SEU-100
System will test, classify, sort, evaluate, grade, and screen the key parameters of devices such as transistors, diodes, fets, rectifiers, zeners, IGBTs, Opto-Coupled, bridges and other related parts
Test library includes tests to perform breakdown voltages, leakage currents, gain tests, saturation, on-state and off-state type tests on the components
PC with a Dell flat screen monitor, keyboard and mouse
Lorlin Windows software.
LORLIN Double Impact (LORLIN DI) is a final test equipment designed to evaluate the performance of electronic devices in a two-stage test process. The system can be used in assembly line testing, service center testing, and engineering test lab environments. The first stage tests are referred to as 'pre-tests' and are designed to quickly identify weak areas in a device, allowing for potential issues to be identified and addressed prior to the second testing stage. During the pre-test, LORLIN DI uses automated unit scanning algorithms to pinpoint any potential issues. This data is then analyzed and prioritized by the machine for further investigation. The second stage tests are referred to as 'post-tests' and use more detailed diagnostic methods to confirm or refute the findings of the pre-test. During the post-test phase, LORLIN DI connects to the device under test and runs various operations such as memory tests and power cycling. The tool is also able to detect cold solder joints and assess insulation resistance, switching parameters, diode testing, and other important criteria. The asset also performs real-time 3D inspections ensuring that parts, materials and components maintained in the correct context. If issues are detected by these 'post' tests, the technology can automatically stop a manufacturing process, alerting users to the issue. LORLIN DI is designed with a modular, scalable design to allow it to be easily adapted to meet the needs of different applications and scales of use. It is engineered to provide up to 900 test pins that can be linked to various probe testers, allowing manufacturers to test and control multiple devices in parallel. As a Double Impact test model, LORLIN DI also integrates both mechanical and electrical testing capabilities, providing versatile testing solutions on a single platform. The equipment also offers advanced fault isolation and repair capabilities. During testing, users can access real-time diagnostic screens to accurately detect and identify faults and the location of their source before it can be fixed. The graphical user interface displays reports with test results and fault locations which can be saved for future use. Overall, LORLIN Double Impact offers a comprehensive final test system for the evaluation of electronic devices. The two stage test process, advanced fault isolation and repair capabilities, as well as real-time testing results allow for devices to be assessed and tested quickly, accurately and cost-effectively. The modular and scalable design of the unit makes it suited for a range of applications, from high volume manufacturing to engineering test lab environments.
There are no reviews yet