Used LTX-CREDENCE ASL-1000 #9151199 for sale

LTX-CREDENCE ASL-1000 is a state-of-the-art final test equipment designed to provide accurate, real-time, electrical test results in high-volume wafer test applications. The system features a high-speed ATE engine, capable of testing over 1,000 die per second, an innovative Mixed-Signal Automation (MSA) unit, and an integrated statistical analysis software package. This machine is built to be rugged, reliable, and easy to use and maintain. The ATE engine consists of a signal path of Differential, DC, and AC analog functions, a digital signal path with high speed counter/timers, IEEE-1149.1/1149.4 JTAG support, and "Vector-Path" access for creating sequences. The tool is available in multiple configurations including single- and dual-wafer handlers. Both systems are capable of acquiring up to 32 multiple-card configurations. The memory sizes for the systems can be configured from 4K to 32K per wafer. The MSA asset of LTX-CREDENCE ASL 1000 is designed to handle a variety of mixed-signal test types including voltage, current, capacitance, and leakage. Utilizing high-speed scan chains, it can test up to 32 die simultaneously, allowing for increased throughput. In addition, it supports a wide range of test protocols including I2C, SPI, and RS-232, allowing it to be used in a variety of test applications. The integrated statistical analysis package provides users with comprehensive results optimization. Real-time and historical results can be monitored, enabling detailed analysis and optimization of test parameters. The software features several powerful run-time algorithms that allow the user to quickly calibrate the test parameters based on current device conditions. Additionally, using a predictive capacity algorithm, the model can optimize the total test time with built-in fatigue monitors, allowing for tested devices with improved yields. Overall, ASL-1000 is an advanced final test equipment, capable of providing reliable, accurate testing in high-volume production applications. Its high-speed ATE and MSA systems, along with its integrated statistical analysis package, will help users obtain the most from their wafer test operations.