Used LTX-CREDENCE ASL-1000 #9201875 for sale
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LTX-CREDENCE ASL-1000 Final Test Equipment is designed for integrated circuit manufacturing, especially for multi-site and multi-CPU wafer level testing. The system is a comprehensive tester, allowing for a range of test capabilities, from basic parametric testing with device characterization to specialized defect isolation and analysis. The unit includes three main components, the test handler, PC interface, and the test suite software. The test handler is a fully automated test platform and comprises both technology-specific test modules, as well as industry-standard measurement modules such as capacitance, leakage current, and voltage. The PC interface allows users to control the machine remotely with a personal computer. This makes it possible to analyze both to basic parametric tests and highly specialized tests with device characterization and defect isolation. While the tool includes multiple industry-standard measurement modules, PC-tunable parameters and algorithms can be used to customize the tests and provide greater flexibility, especially for device characterization. The test suite provided with the asset is the most feature-rich option available. The test suite is designed to be used with both single and multi-site structures, and it allows for tests to be designed for both basic parametric and highly specialized tests. The test suite comes with a variety of filters that can be adjusted according to the specific need of the manufacturer for a given test. Additionally, specialized defect isolation algorithms are also available. These are designed to identify subtle device-level problems that can frequently be difficult to detect during testing. Overall, LTX-CREDENCE ASL 1000 Final Test Model is an advanced solution for integrated circuit manufacturing. With its flexible PC interface and comprehensive test suite, it offers a wide range of capabilities for analyzing both basic parametric and highly specialized tests. The equipment is also capable of detecting subtle device-level problems, making it a valuable tool for manufacturers seeking to optimize their production processes.
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