Used LTX-CREDENCE D10 #9101001 for sale

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Manufacturer
LTX-CREDENCE
Model
D10
ID: 9101001
Vintage: 2006
Tester DIBU DPS16 (3) DIP96-16 2006 vintage.
LTX-CREDENCE D10 Final Test Equipment is a leading edge automated test equipment (ATE) solution that enables fast, efficient and reliable testing of devices. It is particularly well suited to semiconductor components and integrated circuits (ICs) such as microprocessors, system-on-chip devices, digital signal processors and other complex devices. This ATE solution offers advanced test capabilities with multiple operating modes to ensure that all devices are accurately and rigorously tested. The unit features a 10-site platform, low-cost architecture and simultaneous parallel testing, allowing it to address every type of test need. It is capable of performing semi-random to highly advanced memory testing and boundary scan operations, with built-in diagnostics and data capture capabilities. LTX-CREDENCE D-10 test machine has edge-of-the-art hardware, with a powerful 8-GHz dual core processor and high-performance memory for highest-level speed throughput. It uses an innovative, forward-looking and horizontally scalable architecture, allowing for quick scalability and reconfiguration as and when needed. The tool also offers a wide range of test electronics, including a multiformat IO, optimized for Device-Under-Test (DUT) harvesting, low-cost Flip Chip, high-throughput Transistor, and multiple types of passive component testing. Additionally, the asset supports a range of digital boards and advanced features such as powerrail dynamic scanning (DCT) and high-speed digital waveform measurement (HDW). Finally, D 10 Final Test Model is easy to maintain, thanks to its modular architecture and software diagnostics. The equipment also offers on-board diagnostics, error reporting, and test results analysis, making it possible to ensure product quality and ensure reliable results. This advanced ATE system helps ensure accurate and reliable testing of complex devices, making it an invaluable tool for any semiconductor test laboratory.
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