Used LTX-CREDENCE D10 #9408475 for sale

LTX-CREDENCE D10
Manufacturer
LTX-CREDENCE
Model
D10
ID: 9408475
Wafer Size: 12"
Vintage: 2007
Tester, 12" DIBU 2007 vintage.
LTX-CREDENCE D10 Final Test Equipment is a versatile and powerful system designed to meet the most demanding and complex requirements in high-volume test production. The unit's multi-station design and high-speed operation makes it an ideal solution for testing high-volume devices in an efficient and cost-effective manner. The machine is capable of simultaneously conducting a wide range of tests, including functional verification, analog and digital phase measurements, and in-circuit testing. LTX-CREDENCE D-10 includes an advanced testhead offering high through-put, accuracy, parallel operation and advanced programmability. Featuring programmable accuracy to 0.1mV, the testhead offers high-speed and high-resolution measurements, allowing for the rapid testing of even the most complex devices. The tool also includes high-speed, in-circuit test probes for effortlessly executing device testing quickly and cost-effectively. The asset's interface provides easy access for configuration and setup of the test functions. Its user-selectable display options and programmable limit functions allow for fast, efficient testing. The model also includes powerful debugging and diagnostics capabilities, allowing for immersive troubleshooting and debugging. D 10 allows for easy integration, via available standard and proprietary interfaces. This ensures seamless integration with existing test systems and includes support for Ethernet, GPIB, and other bus architectures. The equipment also includes a highly portable and robust enclosure, offering easy maneuverability and setup in a variety of environments. LTX-CREDENCE D 10 is an ideal solution for high-volume device testing. Its multi-station design, multiple testhead options, and powerful debugging functionality make it an ideal choice for high-speed and efficient testing. Its small footprint and robust enclosure make it perfect for efficient and cost-effective testing in a variety of test scenarios.
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