Used LTX-CREDENCE Diamond D10 #9108980 for sale

LTX-CREDENCE Diamond D10 is a "final test" equipment that is used by many high-performance electronics companies to detect any faults and defects in their components. The system has been explicitly designed to provide steady, repeatable test executions that guarantee accurate results with high yields. Diamond D10 features a robust and flexible tester architecture that is suitable for a wide range of applications; multiple tester instruments are able to provide precise device characterization and precise measurements. These instruments help to ensure accurate control over device testing, offering precise control of voltage and current. The instruments also feature built-in protection from test induced damage and performance variability, as well as remote device control. The unit also boasts highly efficient device characterization and testing processes. Advanced capacitive, inductive, and RF characterizing instruments help to ensure accuracy and repeatability in measurements. The instrument cluster is also able to feature a wide variety of statistical analysis and bit pattern capture. LTX-CREDENCE Diamond D10 also provides comprehensive fault detection capabilities, with real-time monitoring during the test as well as digital fault diagnosing. The machine includes a powerful range of test utilities that help to ensure high yields and defectivity. The tool, when used in combination with LTX-CREDENCE patented test software, allows for maximum device performance and yield optimization. This helps to identify any error sources and minimize test time. This ensures the highest possible yield, allowing designers to minimize their losses. The asset also features industry-leading multi-site testing, allowing multiple test sites to be connected and tested in parallel thus saving time and lowering cost. Overall, Diamond D10 is a highly reliable "final test" model that allows for precise, repeatable results. Robust and flexible architecture, together with highly efficient processes and fault detection, help to maximize yield and reduce device failure rate. The equipment's multi-site testing capability further enhances its time-saving and cost-efficiency, making it an ideal choice for many high-performance electronics companies.