Used LTX-CREDENCE Diamond D10 #9242376 for sale

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Manufacturer
LTX-CREDENCE
Model
Diamond D10
ID: 9242376
Vintage: 2015
Tester KEYSIGHT 34401A 6½ Digit multimeter Fixture: 381-5494-00 RAC Slot 0 / VIS16 Slot 1 / VIS16 Slot 2 / VIS16 Slot 3 / VIS16 Slot 4 / DPIN96-64M Slot 5 / VIS16 Slot 6 / VIS16 Slot 9 / DIBU Workstation: Diamond PC P/N: 650-5408-04 XEON 3.6GHZ Test head 1: P/N: 948-1683-00 RA41507-01-BA REV B 381-5131-00\DA BMCI Test head 2: Slot 0 / VIS16 / 671-8195-00 REV AB Slot 1 / VIS16 / 671-8195-00 REV AB Slot 2 / VIS16 / 671-8195-00 REV AB Slot 3 / VIS16 / 671-8195-00 REV AB Slot 4 / DPIN96 / 671-7733-00 REV A Slot 5 / VIS16 / 671-8195-00 REV AB Slot 6 / VIS16 / 671-8195-00 REV AB Slot 9 / DIBU Interposer / 671-7830-01 REV A Includes: Monitor Keyboard Mouse Cables 2015 vintage.
LTX-CREDENCE Diamond D10 is a 'final test' equipment which is capable of testing components and sub-assemblies of products in a single, comprehensive test solution. The system is designed to enable fast turnaround times, optimised board test times and ease of use, making it a great solution for production test engineers facing tight deadlines and high throughput demands. Diamond D10 is a high-performance unit that includes 128 channel switching architecture capable of high signal integrity and throughput performance over mixed signal and digital arrays. The machine can be easily configured with multiple modules to support a wide variety of signals, allowing the user to run a variety of tests that can exceed 500k pins and 10 GHz of digital, mixed signal and microcontroller tests. It also supports patch programming, which allows the user to program up to 4k patch points and up to 3k loads. LTX-CREDENCE Diamond D10 offers a powerful on-board Sequence Compiler, supporting a wide range of languages and feature sets for programming complex test designs and can also generate cross-platform reporting for test programs developed in other services. The tool also features fully automated test diagnostics, custom debugging and fault indication features. This allows users to quickly identify and analyse test and asset failures, aiding the troubleshooting process. Diamond D10 is embedded with flexible design features such as dual test head monitoring, integrated memory trace and test vector data analysis and configurable modular test resource sharing. The model also includes sophisticated networking capabilities, allowing effective and efficient test sharing between both local and remote systems. LTX-CREDENCE Diamond D10 is designed with advanced power cycling, temperature measurement and auto-calibration options in order to enhance equipment sensor accuracy and capabilities, allowing users to perform tests with increased accuracy and reliability. In terms of resource and operating costs, Diamond D10 is both affordable and green, consuming low power and providing a return on investment within a short period of time. Overall, LTX-CREDENCE Diamond D10 provides a comprehensive, reliable and affordable testing solution for a wide range of components and sub-assemblies, making it an ideal choice for final test applications.
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