Used LTX-CREDENCE Fusion MX #9168658 for sale
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ID: 9168658
Vintage: 2008
Tester
Configuration:
(1) WS DEL380
(2) SBAII's
(2) OVI's
(1) HCOVI
(2) VI16B's
(2) DIGHSB's
(2) AWGHSB's
(4) FX1's (64) Channels
RF System:
(1) SMATE 100
(2) SMATE 200's
(1) DVM 34401A
RF16 Port:
(2) Bricks
RF Loadboard kit
RF CAL Kit
Interconnect LB
DCACCal Loadboard
User power unit: DC12V, +-36V
Cbit 64
Stand
MCB:
BIN Display
Remote start
Currently de-installed and warehoused
2008 vintage.
LTX-CREDENCE Fusion MX is a highly complex final test equipment tailored to the specific needs of the semiconductor industry. It is designed to maximize the productivity of test programs and provide a comprehensive inspection and analysis of the device under test. Fusion MX is an integrated suite of hardware and software modules which form a comprehensive system for testing and identifying defects in a wide range of semiconductor integrated circuits. LTX-CREDENCE Fusion MX utilizes a variety of test instruments and tools, including automated digital inspection systems, optical imaging and probing, serial link testers, fault diagnostic systems, as well as AC, DC, and temperature test systems. This unit is typically used to perform wafer tests and pre-packaged device testing. For wafer testing, Fusion MX has the ability to scan up to thousands of devices simultaneously, which helps to speed up the production testing process. The machine also features a powerful thermal management tool, which allows it to detect minute temperature variations during test operations. LTX-CREDENCE Fusion MX is also equipped with a broad range of statistical analysis, trending and predictive models that permit a highly accurate diagnosis and tracking of chip performance characteristics. This provides a basis for improving device yields, as well as for maintaining product quality and reliability over time. Additionally, the asset carries out electrical impedance measurements and is capable of accurately mapping the properties of semiconductor devices. The high-speed and high-density test capabilities of Fusion MX are particularly useful for improving device reliability and performance. Its advanced high-density testing capabilities not only allow it to accurately identify and diagnose device problems, but also scan targeted locations on the device to detect potential performance defects. This model uses advanced software-based computation and predictive models to determine test results. In short, LTX-CREDENCE Fusion MX provides a powerful and highly efficient package for robust testing and analysis of integrated circuits. It is designed for the most demanding applications in the semiconductor industry, and its advanced capabilities make it particularly suitable for contemporary device developments and for meeting industry standards.
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