Used LTX-CREDENCE Kalos XW #9270568 for sale
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LTX-CREDENCE Kalos XW is a comprehensive 'final test' equipment designed for large-scale, robust and high-speed testing of complex IC's (Integrated Circuits). It is equipped with a comprehensive suite of bed of nails, full coverage boundary scan testers, advanced high-speed off-line test and box-level test systems. This system is engineered for test applications involving high frequency and signal integrity characteristics associated with IC's for a broad range of market segments. The unit includes a board diagnostic subsystem, a test head, ATE (Automated Testing Environment), and multiple user interfaces. The board diagnostic subsystem runs the full chain of tests on the ICs, from power-on to functional tests, including both automatic and manual tests. The board diagnostic subsystem is complemented by the test head, which enables multi-channel testing with an optimized combination of hardware, software, and probes. In addition, the ATE offers a powerful, yet intuitive, platform for developing exact test environments for different test cases and IC types. In addition, Kalos XW provides a wide range of user interfaces including RS-232, USB, Ethernet and GPIB (General Purpose Interface Bus). These interfaces allow access to automatic test sequence control, fixture control and test result analysis. The machine's advanced capability is further enhanced with structural and functional test capabilities that support single sided board to high-density multilayer boards. High pin count boards can be tested with multiple test heads with junction-less fault coverage to quickly isolate and characterize faults. LTX-CREDENCE Kalos XW supports both 32 and 64-bit platforms, to accommodate the majority of IC designs, with multiple ATE core platforms and high throughput test capacities ranging up to 192 pins. At the same time, Kalos XW provides fast test time even when testing complex ICs, such as microprocessors, memory, and FPGAs. High speed test interfaces include advanced optical probing technologies, low voltage DC testing, automated probing, and temperature control. Furthermore, the tool integrates advanced data acquisition tools, analysis functions and a powerful scripting language, allowing for rapid prototyping of complex test programs. In addition, LTX-CREDENCE Kalos XW supports the latest technological advancements and includes extended fault coverage, in-depth statistical analysis, state-of-the-art visualization tools, and 100% transparent control of loading and unloading signals. In addition, automated board response diagnostics, automated fault coverage mapping and advanced quantification techniques are among the features available. In conclusion, Kalos XW is a revolutionary 'final test' asset that is designed for the most challenging test requirements. It offers powerful capabilities, enabling customers to quickly develop robust, reliable and high-speed tests for their most advanced devices.
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