Used LTX-CREDENCE Quartet #9213487 for sale

Manufacturer
LTX-CREDENCE
Model
Quartet
ID: 9213487
Vintage: 1990
Tester Prober interface Pogo tower PIB Board Digital and DSP analog per-pin architecture Digital and mixed-signal Fully pin mapped Multisite testing Digital I/O channels: 32 to 512 Formatted data I/O: 200 MHz Clock data I/O: 200 MHz Memory: 8 Meg vector to 64 Meg vector Switch: Period and timing sets Synchronous clock: 128 per Digital pins Low jitter Source / Measure synchronization DSP Analog channels: 4 to 128 Independent scan memory Full spectrum of impedance matched Differential DSP instruments Independent DSP processor per capture instrument Phase coherent: Superclock per DSP instrument Integrated analog and digital UNIX Based workstation Fully integrated network and prober / Handler interfaces (2) Analog segments (4) Independent digital subsystems Test tool Clock speed: 150 MHz Scan: 256 M MP Type: Hinge 256 Channels (2) DPS Vector memory: 16 M PMU 64 Channels: 4 PE Card 8 channels: 32 VI8: 1 DIST B/D: 4 PPM 16 Channels: 16 Cycle length 128 channels: 2 Heat output / Displacement: 20,600 kCal (86,520 J)/100 m³/m Power supply: 187-228 VAC, 3 Phase 1990 vintage.
LTX-CREDENCE Quartet is a final test equipment designed to provide a comprehensive test of semiconductor devices. The system combines four essential tools in one compact platform; a parametric tester, a curve tracer, a semiconductor wafer inspection unit, and an automated interface. All four tools are integrated in one piece of equipment, allowing for improved efficiency and convenience in the production testing of semiconductor components. Quartet test machine features a parametric tester for testing parameters such as gain and slew rate of integrated circuits. The parametric tester is capable of testing both static components and those with dynamic characteristics. It can also be used to test semiconductor die as well as a variety of different package configurations. The tool also offers a programmable wafer curve tracer for testing semiconductor wafers or thin film transistors. This tool is able to measure current, voltage, and capacitance, and can be used to analyze the electrical characteristics of small semiconductor devices. The inspection asset of LTX-CREDENCE Quartet provides a comprehensive view of the tested semiconductor devices. This model is capable of quickly taking photographs of the components, producing high-resolution images that can be used to determine if any defects are present. The equipment also includes advanced algorithms to detect any anomalies in the physical shape of the devices. The images produced by the system are automatically stored in a secure cloud and can be quickly referenced later on in the production process. Finally, Quartet offers an intuitive, automated interface that allows for easy operation without any manual intervention. This interface allows users to quickly and easily configure the unit for a variety of tests, reducing the setup time and improving productivity. For all these reasons, LTX-CREDENCE Quartet is an attractive final test machine for semiconductor production. Its ability to combine four essential tools allows for quick and convenient testing of integrated circuits, wafers, and other components, while its intuitive interface makes it easy to use. All in all, this tool is a great choice for any semiconductor testing task.
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