Used LTX-CREDENCE Sapphire 40 #9189360 for sale

LTX-CREDENCE Sapphire 40 Final Test equipment is a feature-rich, cost effective platform for advanced wafer test functions. It is designed to meet the critical needs of the Extreme Environment of wafer test applications with advanced features. The system features an advanced user interface that supports sophisticated automation and ease-of-use control. With its integrated tools, the unit enables more accuracy and efficiency in testing processes. Sapphire 40 offers the latest in connectivity and advanced design. It is ideal for applications where a number of complex measurements needs to be taken including timing, signal integrity and RF measurements. The machine includes a state-of-the-art measurements server with powerful database access, a host of digital signal analysis functions, as well as sophisticated timing and signal integrity capabilities. The tool is designed to reliably monitor and control a variety of devices including Components such as Photodiodes and Delay Chains, Integrated Circuits (ICs), and a variety of other electrical and electronic devices. The asset also provides advanced programming capabilities such as script generation and parameter configuration, and its extensive library of measurement Access ports/difficulties make it easy to work with a wide variety of devices. The model offers reliable high-precision readings and measurements, providing performance and accuracy that meets or exceeds industry standards. The equipment is highly advanced with easy to use automation with advanced user interfaces. This allows users to build repeatable test methods and programs quickly and easily. The platform also offers a range of interfaces and peripherals that can be configured to run custom tests and evaluate parameters across various types of components. Its flexibility allows users to configure LTX-CREDENCE Sapphire 40 for various test and measurement applications. The system supports the innovative SmartFlex toolkit for advanced debugging and analysis, as well as the capability to capture live trace data from a device under test. Sapphire 40 is an extremely versatile unit for final test use that is capable of tackling a range of challenging test and measurement applications. Its advanced user interface, sophisticated automation and capability to integrate with other tools and peripherals make it an ideal platform for a wide variety of test requirements.