Used LTX-CREDENCE Sapphire NP #293625628 for sale

Manufacturer
LTX-CREDENCE
Model
Sapphire NP
ID: 293625628
Vintage: 2004
Tester THIF (14) D4064 (2) 6A DPS (2) 125A DPS 2004 vintage.
LTX-CREDENCE Sapphire NP is a equipment designed as a final test for various integrated circuits (ICs). It features an advanced scan test methodology that can be incorporated into automated test solutions to deliver the utmost accuracy and integrity of test results. Sapphire NP system offers a powerful combination of features that enable high-volume testing, optimized test time, the lowest possible cost per test, superior fault coverage, and highly reliable results. The unit uses a traditional scan-based test structure, with a complete set of test steps and test algorithms. Each scan test step is tailored to a specific defect, optimizing the test for accuracy and production speed. It is capable of generating highly reliable test patterns at several hundred million operations per second. When combined with user-defined scan test programming, this feature can significantly reduce test time and increase accuracy. In addition to its scan-based test capability, LTX-CREDENCE Sapphire NP machine also has several parameters for customizing test procedures. These parameters include limit testing, trigger scalability, signature testing, vector shrinkage control, test delay reduction, and dynamic power control. These customization options ensure users can fine-tune the tool to their exact test requirements. The asset also features a highly configurable scanning architecture that enables robust, low-volume testing. It offers automated parallel test insertion, sequencing, and analysis. This feature allows the model to divide a test array into multiple, smaller chunks, allowing each of these slices to be tested in parallel. This helps achieve lower test times and greater accuracy across a wide range of configurations. Overall, Sapphire NP is an advanced, dual-purpose scanning test equipment designed to provide ultra-fast test results and superior fault coverage. Its powerful features and high-speed scan-based architecture make it an ideal choice for any IC test application. Thanks to its advanced customization capabilities, this system offers unmatched versatility, allowing users to tailor the unit to their exact test requirements.
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