Used LTX-CREDENCE Sapphire NP #9128065 for sale

LTX-CREDENCE Sapphire NP (formerly known as the Sapphire Scan NP) is a final test equipment designed by LTX-CREDENCE to serve multiple test needs. The system is available in a flexible modular package so it can be customized to meet individual needs. The unit utilizes the advanced automated test handling features of the Sapphire platform. The machine utilizes a built-in handler with load ports for various test IC components, laser marking capabilities and a robotic rail tool for test IC manipulation. This enables incoming and outgoing component flow for fully automated in/out-of-spec handling, as well as test grades and optical inspections. An up-to-date ActiveX control asset enables remote programming and control so operators can quickly monitor status and manage the manufacturing of test IC runs. The platform allows an extensive range of test rates and a variety of test channels for simultaneous test of multiple ICs and probe cards. It can accommodate a wide variety of standard size IC test packages in a single platform. The model also comes with an integrated vision equipment, allowing it to accurately position the probe cards during test IC manipulation. Multiple test configurations are supported, from small <abbr title="Device Under Test">DUT</abbr>s to advanced multi-pin configurations. The system's library management capabilities allow for rapid test recall, enabling faster test runs. Furthermore, the unit offers enhanced test visibility and performance through an extensive list of powerful proprietary software-based yield and test algorithms. The software offers advanced error handling and test replicating functions, allowing the user to quickly diagnose yield and performance issues. One of the main advantages of the machine lies in its flexibility. Its wide range of tool hardware and accessories ensures a variety of applications can be met, including board test, integrated package based test and production test processes. Furthermore, its easy and intuitive software interface and its built-in expandable memory modules enable users to program, analyze, store and debug their tests results. Finally, the asset offers customizable reports, allowing users to evaluate test status, monitor results and perform process activities such as verifications faster. Overall, Sapphire NP is a highly flexible and highly reliable test model which can be used across a variety of applications. Its automated test handling capabilities and ActiveX control enable faster test cycles and better test visibility, while its comprehensive library management allows for faster test recalls. The equipment's large range of hardware and accessories ensure a wide variety of test needs can be met, making it an ideal choice for any IC test solution.