Used LTX-CREDENCE Sapphire #9205876 for sale

LTX-CREDENCE Sapphire is an automated final testing equipment designed to meet the demands of accelerating semiconductor production. The system utilizes advanced, adaptive test methods and technologies to provide the highest detection sensitivity for functional errors and waveforms defects at extremely high speed. Sapphire unit is designed with a scalable platform to meet the needs of any production flow. Its high throughput capabilities enable it to quickly identify product defects and ensure the quality of a device before it moves into the final test phase. The machine's high-speed tester core includes a state-of-the-art Vector Processor, a high-speed digital signal processor (DSP), and a memory accelerator. The Vector Processor is capable of up to 256 million environment points per second (Eepps), equivalent to testing more than 1 billion digital gates per second. The high-speed DSP enables precise, real-time characterization of signal waveforms up to 400 Gigapixels per second. At the base of the tool, advanced precision software and hardware handle the test flow, digital signal processing, and waveform calibration. The software platform allows users to create and execute their own test vectors and includes core power monitoring, data logging, and failure analysis functions. The hardware platform includes multiple sub-systems to provide closed-loop, on-board test assistance. Additionally, LTX-CREDENCE Sapphire asset leverages advanced integrated data analysis algorithms for comprehensive fault detection while also allowing for adjustments to be made for custom requirements. An integrated test container allows for reduced test time, while an expanded range of channel options give users greater flexibility and higher resolution in their testing. Overall, Sapphire model offers semiconductor manufacturers an efficient and reliable solution for fast, accurate test and yield analysis. It delivers high speed, precision, and accuracy for both functional and waveform defects, helping to ensure that devices can meet their specified performance requirements. In the end, this all serves to optimize the production process and reduce test costs while delivering a higher quality and reliable product.