Used LTX-CREDENCE SC 212 #9124511 for sale

LTX-CREDENCE SC 212 is a best-in-class, purpose-built final test equipment designed for the rapid, reliable, and consistent characterization of semiconductor devices. It is easy to set up and ideal for a wide range of test requirements including, but not limited to, RF, current-voltage, and optical parameters. It offers high throughput testing capability compliant with the latest standards and technologies as well as a wide range of user-friendly features for increased productivity. The system is powered by a powerful Xilinx Virtex7 FPGA core and is capable of running at frequencies up to 1 GHz. It features a 2x32-channel (or 8x4-channel) architecture for higher throughput and improved device coverage. The unit also incorporates a high-level, modular software architecture to quickly configure complex device tests with maximum assurance of accuracy and reliability. Test data is stored locally and can be exported in a variety of formats for further post-processing. SC 212 provides a wide range of test capabilities, including but not limited to, transient, parametric, functional, digital, broadband noise, burn-in, and pulse profiling tests. Advanced software features allow for the integration of test plans within the machine, the ability to diagnose faults, intuitive point-and-click test sequencing, and numerous other dynamic conditions. The tool is also capable of probing down to the nanometer scale, meaning that users can test devices with finer detail and accuracy than ever before. To increase safety, LTX-CREDENCE SC 212 is compliant with all relevant safety standards. It is UL, CSA, and TUV certified and designed to minimize electromagnetic interference. The asset also includes a range of built-in diagnostic capabilities such as thermal profiling, fault identification, and high voltage breakover detection. In conclusion, SC 212 is an all-in-one, comprehensive model for testing a wide range of semiconductor devices. It combines powerful features with advanced safety protocols to ensure consistency and reliability in the characterization of high-value semiconductor devices.