Used LTX-CREDENCE SC 212 #9124513 for sale

LTX-CREDENCE SC 212 Final Test Equipment is a sophisticated electrical test system designed for use with automatic test application (ATA) and wafer-level process monitoring. It provides a complete and integrated solution for automated test technology, including design for test (DFT) and test data collection, analysis, and storage. The unit incorporates a modular architecture with built-in scalability and flexibility necessary to support multiple devices, configurations, and wafer sizes for various test applications. The main machine chassis features multiplexers, which are responsible for connecting multiple devices on the tool. The asset also includes a platform for host computers, which is responsible for the communication between the test platform and the PCs. The model components, including multiplexers and PC platforms, communicate with each other to collect and store test data. SC 212 has an intuitive platform that features comprehensive tools for test engineering, such as parameter extraction and test strategy building. Parameter extraction is essential for providing a high level of repeatability and accuracy for all tests. The equipment also has the capability to perform ATE system calibration, which is necessary to maintain unit accuracy and validating test results. The machine is designed with a number of features that improve test throughput. The tool's modular design makes it easy to reconfigure the asset for different test applications, and it is capable of running in both single-wafer and multi-wafer configurations. In addition, the model is capable of automated wafer calibration, which allows for the accurate definition of test parameters across all wafers. The equipment has several other advanced features, such as edge detection, built-in memory and waveform analysis. Edge detection is an important feature in detecting the presence and absence of a device on a wafer. Memory analysis allows for the analysis of stored data to evaluate test results, and waveform analysis is used to characterize the electrical parameters of devices. These features enable the system to provide detailed information and results on the performance of a variety of devices. LTX-CREDENCE SC 212 Final Test Unit is a reliable and powerful test machine that is designed to provide accurate results on wafer-level processing. Its modular architecture and advanced features make it an ideal solution for complex ATE applications. It is a perfect solution for test laboratories that are looking for a comprehensive solution that provides reliable and accurate results.