Used MENTOR GRAPHICS / IKOS Veloce 2 Quattro #9223215 for sale

MENTOR GRAPHICS / IKOS Veloce 2 Quattro
ID: 9223215
Emulator.
MENTOR GRAPHICS / IKOS Veloce 2 Quattro is a final test equipment designed for testing semiconductor devices in the final production stage. It integrates boundary scan, in-circuit test and automated optical inspection technology into a single platform. It offers comprehensive visibility into the device under test, providing granular, real-time information about the design and operation of the device. IKOS Veloce 2 Quattro offers independent test and validation resources for up to 4 devices. With a built-in high-speed image acquisition system, it can capture signals at several gigahertz during the test process. The unit supports fast processor execution speeds, and allows users to take advantage of distributed processing architectures. MENTOR GRAPHICS Veloce 2 Quattro includes a high-speed, single-layer AFM (Atomic Force Microscopy) test station to enable the characterization of device electrical and functional performance when exposed to various stress conditions. Users can also take advantage of a wide range of programming languages and tools for boundary scan, in-circuit and machine-level tests. Veloce 2 Quattro also offers capability for "virtual processing" and "descriptor-based testing", to reduce the cost of device validation and test. MENTOR GRAPHICS / IKOS Veloce 2 Quattro also offers an offline test suite, allowing users to simulate device behavior and create automated tests for production. The tool includes a suite of data acquisition and analysis tools, to allow users to quickly access measurements, asset noise, and device-specific data. The onboard viewer allows users to analyze captured test data. It can be integrated with 3rd party software, and allow users to view the "big picture" of failure analysis, or detailed application testing. The software also features bit-configuration programming, as well as serial and parallel device programming. Overall, IKOS Veloce 2 Quattro is a powerful, efficient, and reliable final test model designed to support a wide range of semiconductor test and validation protocols. It offers integrated hardware/software capabilities, enabling users to optimize production test procedures and achieve faster, more accurate results.
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