Used MOSAID M4205 #9299259 for sale

Manufacturer
MOSAID
Model
M4205
ID: 9299259
Vintage: 2001
Memory tester 2001 vintage.
MOSAID M4205 is a state-of-the-art final test equipment designed for the production environment with maximum efficiency in today's most advanced IC technologies. M4205 provides a scalable test platform with a single, unified hardware architecture that is capable of testing a wide variety of semiconductor devices, from discrete ICs to complex ICs with up to 80 million gates. This high-performance system is based on MOSAID fourth-generation multi-site unit technology, which delivers up to 1,500 pins per site and features the latest technology from industry leaders such as Altera's Max 10 FPGAs and Xilinx's Artix-7 FPGAs. It is optimized to support a variety of memory types, including flash, DRAM, SRAM, and NAND, as well as a wide range of speed grades. Its modular architecture allows for configuration flexibility with both standalone go/no-go and scan-based testing, using up to 800 test channels and four testers in parallel. MOSAID M4205 boasts a wide range of output testing capabilities including analog margin testing, redundant testing, wafer probing, OTP programming, and diagnostic testing. It employs advanced programming and test techniques such as digital signature analysis, bridging resistor detection, and in-machine self-test to ensure the highest level of reliability. M4205 also offers configurable test strategies to increase throughput and improve yield. Additional features include 24 Gb/s external bandwidth, advanced data compression, automated part selection, 100% test coverage with a single independent verification and validation (IV&V) tool, test time optimization through sensing of transistor values, and third party support for CAD database loading and format conversion. MOSAID M4205 is a complete asset, ready to integrate with existing production lines, with a wide range of built-in off-the-shelf diagnostic tools. It is designed to be easy to use and provides comprehensive connectivity, measurement integrity, and test development facilities to help streamline IC device testing, with reduced test costs and a faster time to market.
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