Used MOSAID MS 3440 #9179101 for sale
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MOSAID MS 3440 is a high-performance equipment designed for the fast, reliable testing of complex semiconductor devices. The system rapidly performs a suite of automated tests to verify the reliability and performance of a variety of high-end devices, including DSPs, CPUs, ASICs, FPGAs, mixed-signal ICs, microcontrollers, and memory chips. The unit integrates a powerful software package for testing, including signal, motion control, and diagnostic reporting capabilities. Using an intuitive, graphical user interface, engineers can quickly setup and test their device, along with any custom software and hardware components. For more advanced tests, specialized test scripts written in C/C++, Python, or TCL can also be used. The machine is equipped with 10 channels in total to support a wide variety of patterns and signals. Each channel is capable of providing a wide array of digital and analog test signals at frequencies up to 1 GHz. Furthermore, each channel supports up to 4 DUTs per channel, allowing for concurrent testing and potential cost savings. Each MS 3440 tool provides plenty of I/O ports for connecting to external equipment. These include a variety of serial, Ethernet, and GPIB ports, as well as the ability to connect to a variety of oscilloscopes and logic analyzers. The asset's computer monitor displays the results of tests on the DUTs in real-time, and can be printed or stored for analysis later. Reports can also be customized to accommodate various parameters, such as test type, signal type, serial number, lot history, or test conditions. After all tests have been completed, the model can generate a detailed report on all test results, including a comprehensive performance summary, troubleshooting tips, and analysis of any problems encountered during testing. Overall, the exceptionally fast, versatile, and accurate testing capabilities of MOSAID MS 3440 make it an invaluable asset for any designer or engineer involved in testing intensive top-end electronic devices.
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