Used MOSAID MS 3440 #9361524 for sale

MOSAID MS 3440 is a state-of-the-art final test equipment designed to enable high-performance testing and optimization of semiconductor devices. It features advanced technologies such as MOSAIC (Multiple Optimizations of Semiconductor Assembly and In Circuit) for dynamic adjustment of hardware test parameters, Non-Volatile Memory (NVM) testing capabilities and software-controlled hardware step-by-step analysis. MS 3440 is a versatile test system that covers all stages of test engineering from design validation to production. MOSAID MS 3440 was designed with flexibility and adaptability in mind, allowing for both automated and manual adjustments to be made in order to optimize test hardware in various modes. The test unit performs real-time analysis of functional properties, electrical characteristics and circuit-related parameters for all types of integrated circuits. It combines digital I/O, analogue I/O, and memory stress and verification in one single platform to achieve higher test coverage. In addition, the machine features built-in fault coverage andanalysis methodology to enable high-speed testing. MS 3440 includes an extensive package of functional equipment necessary for accurate testing and optimization of semiconductor devices. It is equipped with up to four thermal stations, a programmable power supply, an advanced temperature control feature, level shifters, mixed signal tester, scopes, logic state analysers and other tools. The tester also contains programmable and recallable hardware configurations, programmable device programming and hardware-automated analysis features. Its configurable hardware includes special high-impedance probes and cables for accurate measurement of low-level signals. In addition, MOSAID MS 3440 features a robust software-controlled programming process that enables precise analysis and optimization of a device's performance. Using the tool's Laser Shifting technology, design engineers can implement asset-level tests, production yield improvements and high-end device characterization. The test model also supports FPGA and CPLD programming and provides a range of configurable and automated design analysis tools. Furthermore, an Intrinsic Fault Coverage Analysis can aid in the detection of hard-to-find defects and yield improvement. Overall, MS 3440 delivers reliable and effective testing and optimization of semiconductor devices for production and development needs. Its sophisticated hardware and advanced software technologies reduce development and manufacturing costs, reduce test time, and improve yield.