Used MOSAID MS 3490 #137684 for sale

MOSAID MS 3490 is a final test equipment designed for the electrical testing and analysis of Dielectric on Silicon (DOSS) devices. The system is designed to increase the accuracy and speed of analyses and testing of next-generation DOSS semiconductor devices, such as display driver ICs and high-speed logic ICs. It offers high-throughput testing and analysis capabilities, with a maximum throughput of 160 devices per second. MS 3490 utilizes a multifunctional scanning microscope for high-precision imaging of devices under test (DUTs). The microscope features a high-precision motorized x-y stage, with an accuracy of less than 5µm. It can be used for imaging, epitaxial layer inspection, leakage current mapping and power consumption measurements. To perform the tests, the unit is equipped with a special three-dimensional test head, which features a wafer-level package, laser bonders and aligners, as well as a light source machine and a temperature sensor. MOSAID MS 3490 tool also includes a sophisticated controller that acts as the brains of the asset. It is capable of controlling both the imaging and testing equipment, allowing for a seamless and automated testing process. The controller also incorporates a data acquisition model, which records data from the voltage and current measurements, as well as the results from the imaging operations. In addition to its testing and imaging capabilities, MS 3490 is capable of generating efficient reports for analysis, which include statistical data, tabular data, graphical data, and images. The data can be exported in a variety of file formats for further analysis. Overall, MOSAID MS 3490 is a powerful and versatile final test equipment that enables rapid and accurate testing and analysis of DOSS devices. Its high-precision microscopy capabilities, advanced testing technologies, and sophisticated controller ensures a streamlined and efficient process, allowing manufacturers to meet their deadlines while producing quality devices.