Used MOSAID MS 3495 #32172 for sale

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Manufacturer
MOSAID
Model
MS 3495
ID: 32172
Tester Test Rate: 20MHz 16x, 16Y,36D Bitmap 72M 288M bit ATCE Part No: 1000501-00 TPG Part No: 1000014-01 APTP Part No: 1000569-00 DDRT Part No: 1000586-01 DDRT Part No: 1000586-01 ARTP Part No: 1000569-00 DCF Part No: 1000006-00 PGEN Part No: 1000417-00 PGEN Part No: 1000417-00 DCX Part No: 1000006-00 CSMP Part No: 1000682-00 CSMP Part No: 1000682-00 TIF Part No: 1000013-00.
MOSAID MS 3495 is a final test equipment that is reliable and easy to use. It is designed for testing a wide range of devices from different wafer process Technologies and is the ideal solution for high-throughput, cost-effective device test solutions. This system comes equipped with a high-performance hardware platform that is built on industry-standard components. It is designed to provide both traditional and advanced electrical test capabilities, with a large range of test parameters such as voltage, current, capacitance and resistance. The unit also supports advanced device characterization and reliability testing such as lifetime, latchup testing, time-dependent dielectric breakdown, and radiation testing. The internal architecture is highly modular, allowing easy expansion and upgrades. This flexible design makes MS 3495 ideal for facilities with high demands on accuracy, throughput and test capability. The machine is also equipped with a user-friendly graphical user interface (GUI). This allows users to quickly configure the tool and access data quickly and accurately. The asset also features an intuitive diagnostics mode, allowing for quick troubleshooting if errors occur. MOSAID MS 3495 comes with a comprehensive software package. This includes drivers, software utilities and test programs to support all common industry test requirements. The software package also includes comprehensive statistical analysis capabilities, allowing users to identify and analyze the root causes of any errors. Overall, MS 3495 is designed to provide reliable and efficient testing for a wide range of devices and is highly recommended for any facility that requires high-throughput and cost-effective device test solutions.
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