Used MOSAID MS 4205 #130311 for sale

MOSAID MS 4205 is a best-in-class final test equipment for high reliability, high-yield non-CE applications. The platform offers a highly accurate and proven approach to yield and defect reduction, which is further enhanced by its unique combination of test and measurement capabilities. At the heart of MOSAID MS4205 is its double defect detection (DDD) methodology, which leverages advanced image sensors, signal analysis algorithms, and automated test strategies. The system is designed to simultaneously monitor and detect shorts, opens, and misconnects at IC, package and board level test points. In addition, the layer and station mapping capability enables the unit to accurately detect faults that can't be revealed with traditional defect inspection methods. The platform includes a range of feature-rich options for customizing the machine to specific end-product requirements. Key components include multi-function multiplexors, test modules, probes, and automated test routines. Depending on configuration and the complexity of the product, MS 4205 can accommodate up to eight eight-site test points and eight six-site test points. In order to maximize throughput and efficiency, MS4205 is designed to replicate the same tests across multiple products at the same time. Test results are automatically evaluated and recorded on the tool's internal database and can be easily retrieved for storage or analysis. MOSAID MS 4205 also offers solutions for cost effective handling of the increasing complexity associated with high volume board manufacturing and product cycles. With an integrated, single-point database and database management capacity, the asset takes into account the entire product cycle—from design specifications, product flows, and manufacturability to test limitations and quality requirements. Overall, MOSAID MS4205 is an advanced, feature-rich test platform that offers reliable quality assurance and cost control for non-CE product processes. Its ability to detect and track defects efficiently and accurately throughout the entire product cycle make it an invaluable final test solution for high-quality, reliable non-CE applications.