Used MOSAID MS 4205 #9071591 for sale

Manufacturer
MOSAID
Model
MS 4205
ID: 9071591
Memory tester.
MOSAID MS 4205 Final Test Equipment is an advanced semiconductor test solution designed for the testing of advanced semiconductor devices. It offers a reliable and efficient solution for the characterization of a wide variety of semiconductor devices, including transistors, diodes, and resistors. The system is capable of testing up to 8 Million devices per hour, ensuring fast and reliable testing. The unit is powered by a Windows-based software interface, MOSAID ScanView™, that provides highly automated probing, device characterization, debugging, and analysis. It has also been designed to support various test scenarios, such as 2D scan mapping, parametric optimization, statistical sampling, and Wafer Level Reliability testing. In addition, it offers a simultaneous visualization of the device actuators and state of the devices. MOSAID MS4205 Final Test Machine features compatible probe cards for a wide range of applications, allowing the user to customize the test tool to their needs. The asset also comes equipped with a variety of test resources, such as temperature and vibration chambers, laser cutters, and a variety of other testing resources. The software suite of the model, MOSAID ProViewPlus, helps to automate the setup of the test parameters and to troubleshoot failed tests. The equipment has been designed for maximum flexibility and scalability, providing the user with a wide range of resources to complete their testing tasks. It includes a host PC with a variety of I/O ports for interfacing external accessories, such as printers, as well as USB, Ethernet, and GPIB connections. The system also features an integrated LIM and backplane, offering fast and reliable test pattern transfer and diagnostics. MS 4205 Final Test Unit is specifically designed to provide cost-effective and precise testing for a variety of advanced semiconductor devices. It features a comprehensive array of features and tests for easy characterization and chip testing, and its scalability and reliable performance make it a great solution for a wide variety of applications.
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