Used MOSAID MS 4205EX #9018299 for sale

MOSAID MS 4205EX is a final test equipment used to evaluate integrated circuit devices wafer sort test applications. It is designed to verify the quality and reliability of semiconductor devices while optimizing test time, cost and yield. This system provides high-speed testing, with the ability to test up to 200 wafers per hour. MOSAID MS4205EX also features advanced pattern encoding technology for superior accuracy, to quickly isolate defective components and quickly rework them. MS 4205 EX utilizes a variety of test parametric measurement techniques, including voltage, temperature, electrical noise, and optical electrochemical parameter testing. All of these tests are performed in the same station to ensure consistent quality and reliability of the final product. In addition to these tests, the unit provides automatic wafer map inspection with both high- and low-resolution imaging. This allows for easy defect diagnosis, leading to a fast turnaround time for product selection and sorting. MS4205EX allows for greater module densities, as well as the ability to sort and cure high-density chips without the requirement of manual intervention. The machine's active probing capabilities facilitate the verification of chip performance, along with the repair of circuit boards and other device defects. In addition to the active probing abilities, MS 4205EX has the capability to evaluate, store and recall device parameters for easy comparison between lots. This tool can also perform advanced pattern testing and comparison techniques, which allow for measuring the performance of high-speed and low-power devices. To ensure maximum accuracy and yield, MOSAID MS 4205 EX is compatible with a variety of DSP and math libraries, providing efficient code synthesis and debug capabilities. MOSAID MS 4205EX's high-speed statistical design analysis tools allow for rapid turn-around of wafer sort results, allowing for high throughput. Automatic test program optimization helps in reducing test time, for signoff of all tested devices. All of the main components of MOSAID MS4205EX can also be quickly swapped out, allowing for a quick changeover between different test requirements. This asset is also compatible with both in-circuit and functional testing, ensuring the highest quality circuit testing. In conclusion, MS 4205 EX is a powerful and efficient final test model for wafer sort test applications. Its advanced pattern encoding, integrated measurement, and debug capabilities make it ideal for device testing and evaluation. Its superior speed, automated test program optimization, and fast changeover capabilities ensure exceptional throughput and an accelerated product delivery time.