Used MOSAID MS 4205EX #9151174 for sale

MOSAID MS 4205EX
Manufacturer
MOSAID
Model
MS 4205EX
ID: 9151174
Memory tester.
MOSAID MS 4205EX is a high-performance, automated semiconductor test equipment designed to end-test high-reliability, high-performance semiconductor components. It is solidly scalable, enabling high-volume production assembly line testing. This system features high-speed data acquisition and analysis for testing single or multi-chip modules with improved throughput, allowing systems engineers to quickly analyze the performance of assembled devices. MOSAID MS4205EX includes modular measurement hardware with available configurations for large bits, wide temperature range, and pin/probe capability. This scalability simplifies operation, streamlining test time. MS 4205 EX also contains advanced automatic test programs for unit verification tests. This includes programs designed specifically for storage testing, integrated multi-engine Accelerated Stress Testing (AST), and multiple software module-level test environments. The machine also has enhanced tool management functions for improved test repeatability, including block mapping, flexible limit sets, and built-in failure analysis features. MS4205EX offers flexibility, high resolution, and programmability in an integrated asset. Its advanced programmability features enable fail-safe operations, high speed data acquisition, detailed test coverage, and analysis of complex sequences. This model is also equipped with modules and probes for testing all types of components, from high pin-count complex ICs to simple MOS digital ones. MOSAID MS 4205 EX offers the most advanced technology for testing high-speed, high-performance, high-reliability semiconductor components. Its modular construction enables it to be used for high-volume production testing, while its advanced automatic test programs and equipment management functions provide accurate, dependable results in both production and laboratory environments. As such, this system is an excellent choice for companies needing to quickly and reliably test complex semiconductor components.
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