Used NEXTEST / TERADYNE Magnum IIx PV-SCM #293619660 for sale

NEXTEST / TERADYNE Magnum IIx PV-SCM is an advanced final test equipment designed to test the yield and reliability of complex device packages. It provides simultaneous parallel testing of both electrical and optical components, combining the latest technologies with best-in-class accuracy, results clarity, and process control. It is equipped with advanced microcontrollers and flash memory that allow it to accurately monitor and analyze the performance of microelectronic components. Its AutoYield capability provides fast statistical trending of the pass/fail parameters, giving the user a comprehensive view of their process performance. The system's parameter-scalable software allows the user to customize the unit to the requirements of their test program and has the ability to increase test coverage. NEXTEST Magnum IIx PV-SCM incorporates extensive die-level analysis capabilities that enable in-depth analysis of test results to trace any problems to their source. It also comes equipped with advanced components such as short-to-ground detection and current measurement, which allow it to accurately detect and identify any defects. The machine also offers a comprehensive and secure data logging tool which records all test parameters and results for further analysis. TERADYNE Magnum IIx PV-SCM is capable of testing up to 500 devices per hour, with a maximum power supply of 20 Watts. It also features a high-speed Laser Diode that can detect submicron defects, allowing improved process performance monitoring. In addition, it offers accurate defect detection by using a built-in imaging asset that reduces the need for physical inspection of the devices. Finally, it is designed with an easy-to-use graphical user interface that drives the user through the setup process, making device programming and test results analysis quick and effortless. Overall, Magnum IIx PV-SCM is an advanced final test model that offers high-speed testing and analysis, ease of use, and robust defect detection capabilities. With its powerful combination of latest hardware and software, it can help designers and manufacturers obtain detailed information about the performance of their test devices and quickly detect any defects in their production.