Used NEXTEST / TERADYNE Magnum SSV-VP #9210666 for sale
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ID: 9210666
Vintage: 2007
System
With MIRAE M520 handler
Site controller: (4) Sites
(5) Slots per site are wired (20 Total)
Test up to 320 uSD cards (80 per site)
HSB1
Loading TCal data from file: Y:\nextest\caldata\tcal_data_102070.bin
Loading VCAL Data on t_hsb1, t_pe32_1
Loading VCAL Data on t_hsb1, t_pe32_2
Loading VCAL Data on t_hsb1, t_pe32_3
Loading VCAL Data on t_hsb1, t_pe32_4
Loading VCAL Data on t_hsb1, t_dps_pmu_1
Loading VCAL Data on t_hsb1, t_dps_pmu_2
Loading VCAL Data on t_hsb1, t_dps_pmu_3
Loading VCAL Data on t_hsb1, t_dps_pmu_4
Unable to adjust TimingCal data for t_hsb1, unrecognized TG hardware revision
active dut = 0
The test program is loaded
TestStarted(1)...
Started: 04/04/18 15:52:50
Site 1 ( Chassis 2, Slot 1 )
Board PWB PWB PWA PWA LVM DBM ECR1 ECR2 X Y D
Name Number Rev Number Rev SDR/DDR MBits MBits MBits bits bits bits
------------------------------------------------------------------------------------------------------
HSBX 503539 2 507487 10 0 (0) 576 (2) 2304(2) 2304(2) 18* 16* 36*
PEXL_1 507834 1 507835 5
PEXL_2 507834 1 507835 5
PEXL_3 507834 1 507835 5
PEXL_4 507834 1 507835 5
DPX20_1 504582 9 508488 4
DPX20_2 504582 9 508488 4
DPX20_3 504582 9 508488 4
DPX20_4 504582 9 508488 4
IPC 505306 5 505305 17 Firmware Revision : 3.6.2
- Revision Codes for Dimms -
DIMM Base PWA PWA LVM DBM ECR
Name Number Number Rev MVec MBits MBits
---------------------------------------------------------------------
DBM-DIMM1 505480 505942 1 288
DBM-DIMM2 505480 505942 1 288
ECR1-DIMM1 505480 505938 1 1152
ECR1-DIMM2 505480 505938 1 1152
ECR2-DIMM1 505480 505938 1 1152
ECR2-DIMM2 505480 505938 1 1152
- Revision Codes for FPGAs -
FPGA SW HW
Name Rev Rev
-------------------------
CPUI Fpga 0x1 0x9
TG1 Fpga 0x1 0x17
TG2 Fpga 0x1 0x17
TG3 Fpga 0x1 0x17
TG4 Fpga 0x1 0x17
TG5 Fpga 0x1 0x17
TG6 Fpga 0x1 0x17
TG7 Fpga 0x1 0x17
TG8 Fpga 0x1 0x17
APG1 Fpga 0x1 0xe8
APG2 Fpga 0x1 0xad
DBM1 Fpga 0x1 0xa3
PSLE1 Fpga 0x1 0x88
PSS1 Fpga 0x1 0x90
PSLE2 Fpga 0x1 0x88
PSS2 Fpga 0x1 0x90
PSLE3 Fpga 0x1 0x88
PSS3 Fpga 0x1 0x90
PSLE4 Fpga 0x1 0x88
PSS4 Fpga 0x1 0x90
LVM1 Fpga 0x1 0x2f
LVM2 Fpga 0x1 0x2f
ECR1 Fpga 0x1 0xb9
ECR2 Fpga 0x1 0xb9
2007 vintage.
NEXTEST / TERADYNE Magnum SSV-VP is a highly automated in-circuit test (ICT) equipment designed for the validation of complex, high-speed embedded electronic boards. NEXTEST Magnum SSV-VP is a powerful and reliable solution for the final test of commercial electronics, industrial circuit boards, and automotive systems. TERADYNE Magnum SSV-VP offers a host of features and benefits that make it an ideal choice for testing requirements. It addresses today's demanding test cycles with its ability to support chip-level test devices and high-speed digital devices. The system features a universal digital instrument architecture and a high voltage/current test source, which enables complex, up-to-date ICT patterns. The in-circuit testing can also be performed at fast production test rates. The open architecture of the unit is designed to ensure versatility and scalability for testing multi-board products, from small form factor cards to large machine-in-package designs. Additionally, it features easy-to-use software for creating or modifying ICT test systems. Magnum SSV-VP offers powerful fault detection performance by combining the board-level accuracy of a fixtureless ICT test tool with reliable, fault-location technology. This includes comprehensive in-circuit diagnostic and test management capabilities, as well as capability for quick diagnostics, and concurrent in-circuit programming and test. Moreover, the asset integrates concise configurable test visualizations, such as LEDs, LCDs, and touch screens, for quick interpretation and accurate results. It is also configured to provide automated offline visual inspection for fine-tuning process control. Overall, NEXTEST / TERADYNE Magnum SSV-VP provides an efficient, reliable, and cost-efficient solution for final ICT test. It is the perfect choice for production environments where fast and accurate testing is crucial. Its intuitive open architecture and user-friendly software make it easy to set up, configure, and maintain various test systems.
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