Used NEXTEST / TERADYNE Magnum SSV-VP #9210666 for sale

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ID: 9210666
Vintage: 2007
System With MIRAE M520 handler Site controller: (4) Sites (5) Slots per site are wired (20 Total) Test up to 320 uSD cards (80 per site) HSB1 Loading TCal data from file: Y:\nextest\caldata\tcal_data_102070.bin Loading VCAL Data on t_hsb1, t_pe32_1 Loading VCAL Data on t_hsb1, t_pe32_2 Loading VCAL Data on t_hsb1, t_pe32_3 Loading VCAL Data on t_hsb1, t_pe32_4 Loading VCAL Data on t_hsb1, t_dps_pmu_1 Loading VCAL Data on t_hsb1, t_dps_pmu_2 Loading VCAL Data on t_hsb1, t_dps_pmu_3 Loading VCAL Data on t_hsb1, t_dps_pmu_4 Unable to adjust TimingCal data for t_hsb1, unrecognized TG hardware revision active dut = 0 The test program is loaded TestStarted(1)... Started: 04/04/18 15:52:50 Site 1 ( Chassis 2, Slot 1 ) Board PWB PWB PWA PWA LVM DBM ECR1 ECR2 X Y D Name Number Rev Number Rev SDR/DDR MBits MBits MBits bits bits bits ------------------------------------------------------------------------------------------------------ HSBX 503539 2 507487 10 0 (0) 576 (2) 2304(2) 2304(2) 18* 16* 36* PEXL_1 507834 1 507835 5 PEXL_2 507834 1 507835 5 PEXL_3 507834 1 507835 5 PEXL_4 507834 1 507835 5 DPX20_1 504582 9 508488 4 DPX20_2 504582 9 508488 4 DPX20_3 504582 9 508488 4 DPX20_4 504582 9 508488 4 IPC 505306 5 505305 17 Firmware Revision : 3.6.2 - Revision Codes for Dimms - DIMM Base PWA PWA LVM DBM ECR Name Number Number Rev MVec MBits MBits --------------------------------------------------------------------- DBM-DIMM1 505480 505942 1 288 DBM-DIMM2 505480 505942 1 288 ECR1-DIMM1 505480 505938 1 1152 ECR1-DIMM2 505480 505938 1 1152 ECR2-DIMM1 505480 505938 1 1152 ECR2-DIMM2 505480 505938 1 1152 - Revision Codes for FPGAs - FPGA SW HW Name Rev Rev ------------------------- CPUI Fpga 0x1 0x9 TG1 Fpga 0x1 0x17 TG2 Fpga 0x1 0x17 TG3 Fpga 0x1 0x17 TG4 Fpga 0x1 0x17 TG5 Fpga 0x1 0x17 TG6 Fpga 0x1 0x17 TG7 Fpga 0x1 0x17 TG8 Fpga 0x1 0x17 APG1 Fpga 0x1 0xe8 APG2 Fpga 0x1 0xad DBM1 Fpga 0x1 0xa3 PSLE1 Fpga 0x1 0x88 PSS1 Fpga 0x1 0x90 PSLE2 Fpga 0x1 0x88 PSS2 Fpga 0x1 0x90 PSLE3 Fpga 0x1 0x88 PSS3 Fpga 0x1 0x90 PSLE4 Fpga 0x1 0x88 PSS4 Fpga 0x1 0x90 LVM1 Fpga 0x1 0x2f LVM2 Fpga 0x1 0x2f ECR1 Fpga 0x1 0xb9 ECR2 Fpga 0x1 0xb9 2007 vintage.
NEXTEST / TERADYNE Magnum SSV-VP is a highly automated in-circuit test (ICT) equipment designed for the validation of complex, high-speed embedded electronic boards. NEXTEST Magnum SSV-VP is a powerful and reliable solution for the final test of commercial electronics, industrial circuit boards, and automotive systems. TERADYNE Magnum SSV-VP offers a host of features and benefits that make it an ideal choice for testing requirements. It addresses today's demanding test cycles with its ability to support chip-level test devices and high-speed digital devices. The system features a universal digital instrument architecture and a high voltage/current test source, which enables complex, up-to-date ICT patterns. The in-circuit testing can also be performed at fast production test rates. The open architecture of the unit is designed to ensure versatility and scalability for testing multi-board products, from small form factor cards to large machine-in-package designs. Additionally, it features easy-to-use software for creating or modifying ICT test systems. Magnum SSV-VP offers powerful fault detection performance by combining the board-level accuracy of a fixtureless ICT test tool with reliable, fault-location technology. This includes comprehensive in-circuit diagnostic and test management capabilities, as well as capability for quick diagnostics, and concurrent in-circuit programming and test. Moreover, the asset integrates concise configurable test visualizations, such as LEDs, LCDs, and touch screens, for quick interpretation and accurate results. It is also configured to provide automated offline visual inspection for fine-tuning process control. Overall, NEXTEST / TERADYNE Magnum SSV-VP provides an efficient, reliable, and cost-efficient solution for final ICT test. It is the perfect choice for production environments where fast and accurate testing is crucial. Its intuitive open architecture and user-friendly software make it easy to set up, configure, and maintain various test systems.
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