Used NEXTEST / TERADYNE Magnum SSV #9407005 for sale

NEXTEST / TERADYNE Magnum SSV
ID: 9407005
Tester.
NEXTEST / TERADYNE Magnum SSV is a high-capacity and highly flexible Final Test Equipment designed for manufacturing and production environments. The system uses powerful test technology to facilitate the development and deployment of specialized test applications with optimal end-product quality. NEXTEST Magnum SSV offers high unit throughput with up to three handlers, ranging from 200 up to over 3,000 devices per hour, depending on the application. The handler options integrate with NEXTEST existing Test Executive software, allowing test engineers to develop, debug, and deploy test programs quickly and easily. TERADYNE Magnum SSV also supports the configuration and use of a variety of test sockets, allowing flexibility and compatibility with different device packages. The test head implementations utilize the highest speed devices with a maximum machine frequency of up to 3GHz, and the ground planes used allow for durable test execution. For easy maintenance, the test head modules are interchangeable, and the tool allows for easy upgrades to newer generations of test heads. For efficient test results, Magnum SSV has an auto-formatting resource, allowing engineers to automatically optimize test program parameters for a range of devices and packages. Advanced software architecture along with I/O and parallel interfaces also allows for simultaneous testing of multiple devices, so engineers can test highly complex test applications with optimal reliability. An additional feature of NEXTEST / TERADYNE Magnum SSV is its ability to integrate with multiple ATE platforms, improving the scalability and interoperability of test systems. The asset allows for multiple test instruments, such as logic analyzers, oscilloscopes, and USB signal generator instruments, to be used simultaneously, increasing the efficiency of tests. Overall, NEXTEST Magnum SSV is a high-performance and flexible Final Test Model designed for testing and debugging of a variety of devices and packages, while offering an easy to use interface and high equipment throughput. With its integrated test sockets, advanced software architecture and scalability of test instruments, it is an optimal choice for improved end-product quality.
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