Used NEXTEST / TERADYNE Magnum SV 1024 #9163317 for sale

NEXTEST / TERADYNE Magnum SV 1024
ID: 9163317
Test systems (2) Stackable chassis (10) Site assemblies with (160) channels (1024) Digital channels (10) Test site controllers (128) DUT Power supplies (64) Systems PMU (1024) Per-pins PTU (160) High voltage pins Host computer with LED display Currently installed.
NEXTEST / TERADYNE Magnum SV 1024 is a final test equipment designed for advanced probing and test of semiconductor devices from wafer level to end products. It offers high accuracy and repeatability at testing the highest density chips. NEXTEST Magnum SV 1024 utilizes NEXTEST CENTEST architecture with its industry-leading precision and fault coverage. This architecture enables a wide range of test capabilities — from wafer probes to package tests, and from characterization tests to functional tests. TERADYNE Magnum SV 1024 is a 3-station system designed for wafer-level tests with high accuracy and repeatability. Its high accuracy is enabled by its 10 micron piezo-driven positioning accuracy. Its repeatability is up to 1 micron enabled by its vision-based die-finding algorithms and optical autofocus. Magnum SV 1024 also features a high throughput flexible test station. This station is a multi-function tester which can support up to 24 slots — providing precise testing for many different device types. This station offers the ability to test devices from wafer level to finished products. The Magnum SV also features a fast I/O station, which allows multiple devices to be tested in parallel — enabling tests to be carried out quickly and at high-speeds. Finally, NEXTEST / TERADYNE Magnum SV 1024 offers a variety of reliable, cost-effective, and scalable solutions for testing complex devices. These include parallel test capabilities and "bite-measure", "remote sensing" and "mixed signal" options. The unit is also supported by TERADYNE comprehensive services and support team. NEXTEST Magnum SV 1024 is an advanced final test machine that enables high accuracy and repeatability at testing the highest density chips. It offers flexible stations that can be used for both wafer level and finished device tests, with high throughput testing abilities. The tool has provides a reliable and cost-effective solution for semi-conductor devices testing.
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