Used NEXTEST / TERADYNE Magnum SV #178628 for sale
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ID: 178628
Vintage: 2008
Tester
Tester Os: H1.1.23A\UI: H2.2.11\h2.3.16A
Pin Count: 1024
Data Rate (Unit:Mhz): 100
VRC-16: 2
ECR (Unit: M): 288
DBM (Unit: M): 288
LVM (Unit: M): 4
Slot A- 0: IPC
Slot A- 1: Site board
Slot A- 2: Site board
Slot A- 3: Site board
Slot A- 4: Site board
Slot A- 5: VRC board
Slot B- 0: IPC
Slot B- 1: Site board
Slot B- 2: Site board
Slot B- 3: Site board
Slot B- 4: Site board
Slot B- 5: VRC board
2008 vintage.
NEXTEST / TERADYNE Magnum SV is a "final test" solution providing an all-in-one and cost-effective solution for high-volume device testing. This equipment is designed around the IEEE 1149.1 standard, commonly referred to as the JTAG standard, and is capable of testing Printed Circuit Boards (PCBs) of up to eight layers at speeds of 6-8 inches per second. NEXTEST Magnum SV houses a detection logic component that reads and interprets the design data set (DDS) from multiple test instrumentation modules. On each PCB, TERADYNE Magnum SV receives signals from as many as 64 test points at a time. The design data set (DDS) is generated by specialized proprietary deterministic test pattern generation (DTPG) software, which optimizes test coverage and execution time. Magnum SV can test many types of devices including logic, digital devices, arrays, memories, and analog devices. To accomplish this task, the system's probes are connected to multiple nodes on the PCB, allowing it to map out each components state during the test. After data collection, NEXTEST / TERADYNE Magnum SV's advanced Data Analysis & Decompilation (DAD) software is able to generate detailed test results and failure reports, if necessary. In addition to its test capabilities, NEXTEST Magnum SV provides access to a broad range of features such as: real-time data visualization, programmable response rate control, and granular traceability. The unit also comes with an intuitive embedded graphical user interface (GUI), providing the user the ability to customize different processes, such as pattern generation, visualization, and reports. In conclusion, NEXTEST/TERADYNE Magnum SV is a full-featured test machine that provides users with a robust solution for performing high-volume device test processes with the highest levels of accuracy and throughput. Through the concepts of programmable response rate control and granular traceability, the tool provides ICT, FVT and HVT functions in a single platform, allowing users to synchronize test processes with minimal cost and time. This makes Magnum SV a highly attractive solution for high-volume manufacturers.
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