Used NEXTEST / TERADYNE Maverick II ST #9279295 for sale

NEXTEST / TERADYNE Maverick II ST is a high performance and advanced 2nd generation test equipment designed for today's most complex System-in-Package (SiP), semiconductor-on-board (SOB), and conventional assemblies. NEXTEST Maverick II ST can be configured to provide optimal test coverage with its solution-oriented platform, while enabling flexible test strategies that reduce test cost and accelerate test time. TERADYNE MAVERICK II-ST's integrated multi-die architecture provides test coverage of up to 1080 I/O channels and features interchangeable VXI and PXI modules that can be configured to meet the customer's needs. Additionally, it offers industry-leading performance with its best-in-class throughput, signal integrity, and multiple, simultaneous test channels. The unit also offers an ultra-high pin count multi-gate support to ensure a comprehensive gate coverage of the device at test. NEXTEST / TERADYNE MAVERICK II-ST also enables flexible test strategies through its powerful test executive software, with a host of features designed to streamline test planning and implementation. Its Test Entry Point Solution and Multiple Test Flows support enable users to take advantage of order-independent testing strategies when appropriate, or easily develop Test Entry Point and Test flow specific strategies as needed. Furthermore, the machine provides advanced diagnostic capabilities, including tool recognition, test data analysis, and pattern generation and test debug tools. Maverick II ST final test asset is built on an open platform, allowing users to integrate multiple software applications, hardware components, and third-party solutions. The powerful model offers a high level of flexibility, allowing users to customize their experience to meet their individual needs. Overall, TERADYNE Maverick II ST is a powerful and versatile final test equipment, designed to provide comprehensive test coverage with its best-in-class performance and efficient test strategies. With its modular architecture, open platform capabilities, and advanced diagnostic tools, the system is an ideal solution for testing today's complex SiP, SOB, and conventional assemblies.