Used NEXTEST / TERADYNE Maverick PT HF #9274741 for sale

ID: 9274741
Testers Test head: PT HF Chassis Manipulator: Rack Computer Interface card Cal DUT: HF Type APG (4) PE.
NEXTEST / TERADYNE Maverick PT HF is a high-performance final test equipment designed to enable manufacturers in automotive, industrial, consumer and communications markets to rapidly and accurately test a variety of electronic components. This system is built for all levels of complexity from simple-to-complex electronic designs. NEXTEST Maverick PT HF unit features a high-performance test structure designed to maximize automation efficiency. It utilizes a modular architecture, allowing for easy scalability as production requirements increase. This machine is built on NEXTEST Eclipse Functional Test Platform, providing advanced test capabilities such as Embedded Performance Verification (EPV) and automatic fault diagnosis. In addition, it also offers software configurability and real-time scripting for robust functional test coverage and quick test set-ups. The test tool combines high-speed test heads with advanced signal conditioning and switching to facilitate precise test outcomes. It supports digital and analog signals up to 8GHz for fast test execution. The advanced optical switches provide superior electrical performance with low insertion loss. In addition, TERADYNE MAVERICK PTHF incorporate advanced pattern recognition, allowing users to simulate power cycles, visualize faults and complex patterns and automate electrical tests. It comes with an intuitive Test Executive application which provides a simple graphical user interface for programming, debugging, and monitoring the tests. MAVERICK PTHF integrates into all industry standard production floors, offering scalability and flexibility. This asset is designed to meet the needs of current and future generations of testing requirements. It is available in multiple configurations to suit various test needs. All of these features and capabilities make NEXTEST MAVERICK PTHF an ideal model for achieving precise test outcomes in the shortest possible time.
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