Used NEXTEST / TERADYNE Maverick PT-II #9100711 for sale

NEXTEST / TERADYNE Maverick PT-II is a market-leading semiconductor "Final Test" equipment, primarily used for the testing and inspection of completed semiconductor and IC devices. This comprehensive platform combines industry-leading domain expertise in digital, mixed-signal and analog technologies with the most advanced hardware and software technologies to meet the needs of today's high performance, high-end semiconductor manufacturing. NEXTEST Maverick PT-II system utilizes NEXTEST NAOS architecture, which enables the platform to meet a wide range of application requirements. The architecture supports a wide range of test strategies and test parameter definitions, offering greater flexibility, speed, and virtually no limits on test time. With its high-speed data capture and analysis capabilities, the platform can test a variety of complex designs with extreme accuracy. It also ensures that device operating parameters including: voltage, current, frequency accuracy, transition time and peak power levels are accurately measured and monitored during functional testing. Furthermore, TERADYNE MAVERICK PT II unit offers advanced test machine automation and data management, with integration with related test systems. It is equipped with automatically generated and managed test scripts, allowing users to quickly design, modify and deploy tests with minimal manual effort. The platform supports various configurations of devices, such as bare die, CSP, and wafer scale. It also allows users to import device configuration modules and program them into the tool. NEXTEST MAVERICK PT II is an industry-leading solution in the semiconductor Final Test domain and is designed to meet customers&#3 9; most stringent evaluation requirements. Its advanced detection and diagnostics capabilities, combined with its powerful automation functionality, allow for the testing and validation of various device designs and layout. This platform enables users to develop, integrate and deploy the most advanced test programs and strategies. In addition, its advanced data management and analysis, as well as flexibility, make it an ideal solution for any semiconductor test and inspection application.