Used NEXTEST / TERADYNE Maverick PT-II #9122402 for sale

ID: 9122402
Vintage: 2002
Tester (64) Digital Channels Error Catch RAM (ECR), 144M Superset Architecture 33/66/133 MHz Maximum Test Rate Algorithmic Pattern Generator Data Buffer Memory, 144M Drive Levels-per-pin (4) Parametric Measurement Units (4) Device Power Supplies PC Workstation with NextSoft Release 128M Bytes Main Memory 40G Byte Disk Standard 17" CRT Display (1) DUT BD, PT, 1Site with Connector 2002 vintage.
NEXTEST / TERADYNE Maverick PT-II is a high-performance final test equipment designed to meet the needs of integrated circuit manufacturers that need automated test and measurement of multiple processes simultaneously. NEXTEST Maverick PT-II is an all-in-one test system that can be used for final testing, burn-in testing, YieldStar, visualization, package testing, fault isolation, software validation, Return-to-Zero-Test (RTZ), and thermal characterization. TERADYNE MAVERICK PT II's high throughput, flexibility, scalability, and scalability make it ideal for the testing and measurement needs of any PCB development, development of high-quality digital and analog electronics, and circuity Validations. Maverick PT-II utilizes an extensive array of technologies including the PC-based TestStation software, TestStation Console, Device Master, Multi-Level Timing Board, RTZ Board, Multi-Test Board, and Dynamic Measurement Units. These features provide an intra-functional operation for testing up to 32 devices simultaneously on a single network. MAVERICK PT II incorporates a Unit on a Chip(SoC)-based test machine and a high-speed serial bus, allowing for concurrent multi-device testing with up to 10,000 stimulus-response pairs per second. Its advanced functional test applications are able to support memory, logic, memory-map, and programmable logic devices and are able to work closely with In-circuit Test Board, a Prober Station, or an Automatic Handler. TERADYNE Maverick PT-II's advanced programming and debugging capabilities provide for testing and isolating design faults in a controlled environment easily and quickly. NEXTEST / TERADYNE MAVERICK PT II also offers a complete array of diagnostic tools, including probe cards, visualizers, and statistical tools. NEXTEST MAVERICK PT II's Probe Card Manager (PCM) is designed to closely monitor the operation and performance of probe cards to provide an accurate diagnosis of defective devices. NEXTEST / TERADYNE Maverick PT-II also offers real-time data analysis and visualization, enabling engineers to quickly verify design parameters, identify patterns and trends in complex data, and monitor the test tool functionality. This data analysis and visualization helps engineers quickly isolate defects and validate designs. Test data is stored on NEXTEST Maverick PT-II's Hard Disk Drive (HDD) for subsequent validation, implementation, and data storage. TERADYNE MAVERICK PT II also provides an optional Log Analysis Application for analyzing test data and producing comprehensive reports. Maverick PT-II offers a comprehensive suite of software and hardware tools to address all stages of production and quality assurance. Its robust data acquisition and analysis capabilities, coupled with smart automation, make it an indispensable tool for advanced product testing and quality assurance.
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