Used NEXTEST / TERADYNE Maverick #9226514 for sale
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NEXTEST / TERADYNE Maverick is a single-site, multi-module test solution for the final test of semiconductor components. NEXTEST Maverick equipment consists of a mainframe, four Universal Interface Modules (UIM) and up to four Universal Test Modules (UTM). It is capable of testing digital, analog, and mixed-signal products at high speed and at accurate test conditions. TERADYNE Maverick mainframe is the platform which controls the signal paths, generates the test stimuli, and monitors the test results. It is also responsible for communication with an external host for test program development, real-time control, and data collection. It contains an powerful ADC/DAC mezzanine for precise analog measurements and four user-configurable switching networks. The mainframe has two communication interfaces - the IEEE-488 GPIB with up to 15 devices and an RS-232C interface. The Universal Interface Module (UIM) consists of four Programmable Output Drivers (PODs) and two Programmable Input Multiplexers (POMs). Each POD can generate up to eight analog or digital signal paths up to +/- 10 volts. The POMs can provide a maximum of 16x8 multiplexed signal paths up to +/- 10 volts. All UIMs are identical and are powered by the mainframe. Maverick Universal Test Modules (UTMs) consist of both analogue and digital test instrumentation. They are capable of providing stimulus or measure analog or digital signals with high accuracy and high speed. The UTMs are discrete or in-line designs and can be used in dynamic, passive and active test configurations. NEXTEST / TERADYNE Maverick system uses software-driven power selection to ensure the device being tested is always receiving the correct power levels. Also, NEXTEST Maverick unit is capable of providing wafer probers for wafer level tests. The machine can also be configured to provide full device characterization of advanced semiconductor devices. It offers up to six sites for device test and debug needs. TERADYNE Maverick tool also supports a variety of external instruments, such as oscilloscopes, logic analysers, and probes, for data collection and analysis. In conclusion, Maverick asset is a very capable and versatile test solution for the final test of semiconductor components. It has a mainframe which controls all the components, the UIMs for signal paths, and up to four UTMs for analogue and digital tests. With its ability to provide wafer probers and full device characterization, NEXTEST / TERADYNE Maverick model is a very scalable and complete solution for device test and debug.
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