Used NIKON N-SISVR #9157716 for sale

NIKON N-SISVR
Manufacturer
NIKON
Model
N-SISVR
ID: 9157716
Tester Field size: 65 X 65mm.
NIKON N-SISVR is a high performance final test equipment designed for Ic socket or die testing. It features the latest in automated electrical test technology for the most demanding performance requirements. The system is available in two models with different performances. NIKON N SISVR-M is a mid-range version offering high-speed testing for up to 500 samples, while N SIS VR-H is a high-end version offering high-speed testing for up to 1000 samples. N SISVR features a powerful combination of advanced hardware and software to ensure high accuracy and speed. The unit is based on a variety of components that are integrated to provide a complete solution. The hardware includes a controller, test head, test head cables, clamps, test cells, power supplies, and test head control panels. The controller is a DSP driven device with 1024 MB RAM, an 8-channel high-speed Ethernet connection, and up to 16 differential Analog-to-Digital Converters (ADCs) and Digital-to-Analog Converters (DACs). This provides a high-speed, accurate test machine which can handle up to 32 test channels. N-SISVR also provides a variety of test options, including electrical, mechanical, and temperature testing. All tests are conducted using a built-in calibration tool. The calibration asset uses high-precision laser interferometers to ensure accuracy and repeatability of each test. The test head cables and clamps are designed to ensure the best possible connection between the test sample and test head. The test head control panels feature dedicated digital inputs and outputs for controlling and monitoring the test status. NIKON N-SISV-R is designed to minimize downtime with features such as thermal cycling, auto-retracts, and T-zero detection. The auto-retracts automatically retract and release the pins on the test socket when not in use. This improves efficiency and prevents damage to the test sockets from excessive use. The thermal cycling feature provides thermal-cycling capability to test components in various temperature ranges. This helps to extend a component's life by testing it in a wide variety of temperature environments. Finally, T-zero detection accurately detects when the test starts and stops, resulting in an improved test accuracy. N-SISV-R is a highly reliable and high speed test model that provides accuracy and repeatability. The equipment is designed with the latest technologies and advanced features to ensure reliable performance for a variety of applications. It provides a variety of test options including electrical, mechanical, and temperature testing with dedicated digital and analog inputs. The built-in calibration system and thermal cycling allow it to accurately detect when a test starts and stops, which increases accuracy and improves efficiency. Finally, the auto-retracts and T-zero detection make the unit less prone to damage and increases reliability.
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