Used SCHLUMBERGER IDS P3X #293586978 for sale
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ID: 293586978
Vintage: 2000
Focused ion beam system (FIB)
Manuals included
2000 vintage.
SCHLUMBERGER IDS P3X is a state-of-the-art final test equipment designed to test the functionality, integrity and performance of integrated circuits. It is a full-instrumentation platform for testing a variety of semiconductor and microelectronic devices. The P3X system benefits from a number of advanced technologies, enabling fast and reliable testing. The unit utilizes a four-dimensional approach - testing speed, electrical parameters, thermal parameters, and parametric testing - to effectively measure chip performance. This allows for a much more detailed analysis of the device, enabling the detection of any defect or abnormality in the design or implementation of the device. The P3X is equipped with a variety of test instruments and software packages. Using the built-in wideband voltage-range analyzer, the machine can accurately measure parameter values, thermal conditions and other electrical characteristics. It also incorporates advanced parameter extraction and test methodology to ensure the most accurate results. The P3X is also equipped with a number of automated testing features. An automatic die-level program allows for the rapid evaluation of integrated circuit at the chip level. This helps to reduce the cost and time associated with testing and analysis. Additionally, the tool supports the use of both manual and automated scanning to optimize the test and verification process. Finally, the P3X uses a sophisticated software platform to provide comprehensive data analysis and reporting. This enables users to quickly identify any anomalies or defects in the chips being tested. In addition, the asset is able to generate highly detailed reports, which can be used for product validation or for research purposes. To sum it up, IDS P3X is an advanced test model that offers comprehensive test solutions and advanced parameter extraction and test methodology. The equipment allows for rapid and reliable testing, providing reliable and accurate results. The automated testing features and comprehensive data analysis capabilities make it an ideal choice for testing and evaluating a variety of integrated circuits and microelectronics.
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